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參數(shù)資料
| 型號(hào)： | 933769310602 |
| 廠商： | NXP SEMICONDUCTORS |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | F/FAST SERIES, OCTAL 1-BIT DRIVER, TRUE OUTPUT, PDIP20 |
| 封裝： | 0.300 INCH, PLASTIC, DIP-20 |
| 文件頁(yè)數(shù)： | 6/10頁(yè) |
| 文件大?。?/td> | 94K |
| 代理商： | 933769310602 |
Philips Semiconductors
Product specification
74F540, 74F541
Buffers
1990 Jan 08
5
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
NO TAG
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONSNO TAG
MIN
TYP
NO TAG
MAX
UNIT
IO = 3mA
±10%VCC
2.4
V
VO
High level output voltage
VCC = MIN,
VIL = MAX
IOH = –3mA
±5%VCC
2.7
3.4
V
VOH
High-level output voltage
VIL = MAX,
VIH = MIN
IO = 15mA
±10%VCC
2.0
V
IOH = –15mA
±5%VCC
2.0
V
VO
Low level output voltage
VCC = MIN,
VIL = MAX
IO = MAX
±10%VCC
0.55
V
VOL
Low-level output voltage
VIL = MAX,
VIH = MIN
IOL = MAX
±5%VCC
0.42
0.55
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
–1.2
V
II
Input current at maximum input
voltage
VCC = 0.0V, VI = 7.0V
100
A
IIH
High-level input current
VCC = MAX, VI = 2.7V
20
A
IIL
Low-level input current
VCC = MAX, VI = 0.5V
–20
A
IOZH
Off-state output current
High-level voltage applied
VCC = MAX, VO = 2.7V
50
A
IOZL
Off-state output current
Low-level voltage applied
VCC = MAX, VO = 0.5V
–50
A
IOS
Short-circuit output currentNO TAG
VCC = MAX
–100
–225
mA
ICCH
In=OEn=GND
22
30
mA
74F540
ICCL
In=4.5V, OEn=GND
58
75
mA
ICC
Supply current
ICCZ
VCC = MAX
In=GND, OEn=4.5V
40
55
mA
ICC
y
(total)
ICCH
VCC = MAX
In=4.5V, OEn=GND
30
40
mA
74F541
ICCL
In=OEn=GND
55
72
mA
ICCZ
In=GND, OEn=4.5V
45
58
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value under the recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS should be performed last.
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