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參數(shù)資料
| 型號： | 935006790112 |
| 廠商： | NXP SEMICONDUCTORS |
| 元件分類： | 尋呼電路 |
| 英文描述： | TELECOM, PAGING RECEIVER, PDSO28 |
| 封裝： | 7.50 MM, PLASTIC, MS-013AE, SOT-136-1, SOP-28 |
| 文件頁數(shù)： | 18/46頁 |
| 文件大?。?/td> | 578K |
| 代理商： | 935006790112 |
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1996 Jan 15
25
Philips Semiconductors
Product specication
Advanced pager receiver
UAA2080
TEST INFORMATION
Tuning procedure for AC tests
1. Turn on the signal generator: fgen =fi(RF) + 4 kHz, no modulation, Vi(RF) = 1 mV (RMS).
2. Measure the IF with a counter connected to test pin TPI. Tune C16 to set the crystal oscillator to achieve fIF = 4 kHz
Change the generator frequency to fgen =fi(RF) 4 kHz and check that fIF is also 4 kHz. For a received input
frequency fi(RF) = 172.941 MHz the crystal frequency is fXTAL = 57.647 MHz, while for fi(RF) = 469.950 MHz the
crystal frequency is fXTAL = 78.325 MHz. For a received input frequency fi(RF) = 930.500 MHz an external oscillator
signal must be used with fi(OSC) = 310.1667 MHz and a level of 15 dBm (for definition of crystal frequency, see
Table 1).
3. Set the signal generator to nominal frequency (fi(RF)) and turn on the modulation deviation ±4.0 kHz, 600 Hz square
wave modulation, Vi(RF) = 1 mV (RMS). Note that the RF signal should be reduced in the following tests, as the
receiver is tuned, to ensure Vo(IF) = 10 to 50 mV (p-p) on test pins TPI or TPQ.
4. Tune C15 (oscillator output circuit) and C12 (frequency multiplier output) to obtain a peak audio voltage on pin TPI.
5. Tune C3 and C6 (RF input and mixer input) to obtain a peak audio voltage on pin TPI. When testing the mixer input
sensitivity tune C23 instead of C3 and C6 (test circuit Fig.5).
6. Check that the output signal on pin TPQ is within 3 dB in amplitude and at 90
° (±20°) relative phase of the signal on
pin TPI.
7. Check that data signal appears on output pin DO and proceed with the AC test.
AC test conditions
Table 5
Denitions for AC test conditions (see Table 6)
SIGNAL
DESCRIPTION
Modulated test signal 1
Frequency
172.941, 469.950 or 930.500 MHz
Deviation
±4.0 kHz
Modulation
1200 baud pseudo random bit sequence
Rise time
250
±25 s (between 10% and 90% of final value)
Modulated test signal 2
Deviation
±2.4 kHz
Modulation
400 Hz sinewave
Other denitions
f1
frequency of signal generator 1
f2
frequency of signal generator 2
f3
frequency of signal generator 3
f
cs
channel spacing (20 kHz)
P1
maximum available power from signal generator 1 at the test board input
P2
maximum available power from signal generator 2 at the test board input
P3
maximum available power from signal generator 3 at the test board input
Pi(ref)
maximum available power at the test board input to give a Bit Error Rate (BER)
≤ 3100 for the modulated
test signal 1, in the absence of interfering signals and under the conditions as specified in Chapters
“AC characteristics (173 MHz)”, “AC characteristics (470 MHz)” and “AC characteristics (930 MHz)”
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