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參數(shù)資料
| 型號(hào)： | 935052320602 |
| 廠商： | NXP SEMICONDUCTORS |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | F/FAST SERIES, OCTAL 1-BIT DRIVER, TRUE OUTPUT, PDIP20 |
| 封裝： | 0.300 INCH, PLASTIC, SOT-146-1, DIP-20 |
| 文件頁(yè)數(shù)： | 8/12頁(yè) |
| 文件大小： | 94K |
| 代理商： | 935052320602 |
Philips Semiconductors
Product specification
74F244/74F244B
Octal buffers (3-State)
1994 Dec 5
5
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
LIMITS
UNIT
SYMBOL
PARAMETER
CONDITIONS1
MIN
TYP2
MAX
UNIT
VCC = MIN,
IOH = -3mA
±10%VCC
2.5
V
VOH
High-level output voltage
VIL = MAX,
±5%VCC
2.7
3.4
V
VIH = MIN
IOH = -15mA
±10%VCC
2.0
V
±5%VCC
2.0
V
VOL
Low-level output voltage
VCC = MIN,
VIL = MAX,
IOL = MAX
±10%VCC
0.55
V
VIH = MIN,
±5%VCC
0.42
0.55
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
-0.73
-1.2
V
II
Input current at maximum input voltage
VCC = MAX, VI = 7.0V
100
A
IIH
High-level input current
VCC = MAX, VI = 2.7V
20
A
74F244 OEa, OEb
-1.0
mA
IIL
Low-level input current
74F244 Ian, Ibn
VCC = MAX, VI = 0.5V
-1.6
mA
74F244B all inputs
-40
A
IOZH
Off-state output current,
high-level voltage applied
VCC = MAX, VO = 2.7V
50
A
IOZL
Off-state output current,
low-level voltage applied
VCC = MAX, VO = 0.5V
-50
A
IOS
Short-circuit output current3
VCC = MAX
-100
-225
mA
ICCH
40
60
mA
74F244
ICCL
VCC = MAX
60
90
mA
ICC
Supply current (total)
ICCZ
60
90
mA
ICCH
20
30
mA
74F244B
ICCL
VCC = MAX
50
70
mA
ICCZ
29
40
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
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