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參數(shù)資料
| 型號： | 935260966005 |
| 廠商： | NXP SEMICONDUCTORS |
| 元件分類： | 尋呼電路 |
| 英文描述： | TELECOM, PAGING RECEIVER, UUC28 |
| 封裝： | DIE-28 |
| 文件頁數(shù)： | 18/43頁 |
| 文件大?。?/td> | 525K |
| 代理商： | 935260966005 |
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1996 Jan 15
25
Philips Semiconductors
Product specication
Advanced pager receiver
UAA2082
Table 6
AC test conditions; notes 1 and 2
Notes
1. The tests are executed without load on pins TPI and TPQ.
2. All minimum and maximum values correspond to a bit error rate (BER)
≤ 3100 in the wanted signal (P1).
3. The BER measurement is started 5 ms (ton(max)) after VRE goes HIGH; BER is then measured for 100 bits
(BER
≤ 3100).
SYMBOL
PARAMETER
CONDITIONS
TEST SIGNALS
αa
adjacent channel selectivity;
Fig.11(b)
f2 =f1 ±fCS
generator 1: modulated test signal 1
P1 =Pi(ref) +3dB
generator 2: modulated test signal 2
P2 =P1 + αa(min)
αc
co-channel rejection; Fig.11(b)
f2 =f1 ± up to 3 kHz
generator 1: modulated test signal 1
P1 =Pi(ref) +3dB
generator 2: modulated test signal 2
P2 =P1 αc(max)
αsp
spurious immunity; Fig.11(b)
f2 = 100 kHz to 2 GHz
generator 1: modulated test signal 1
P1 =Pi(ref) +3dB
generator 2: modulated test signal 2
P2 =P1 + αsp( min)
αim
intermodulation immunity;
Fig.11(c)
f2 =f1 ±fcs; f3 =f1 ± 2fcs
generator 1: modulated test signal 1
P1 =Pi(ref) +3dB
generator 2: unmodulated
P2 =P1 + αim(min)
generator 3: modulated test signal 2
P3 =P2
αbl
blocking immunity; Fig.11(b)
f2 =f1 ± 1 MHz
generator 1: modulated test signal 1
P1 =Pi(ref) +3dB
generator 2: modulated test signal 2
P2 =P1 + αbl(min)
foffset
frequency offset range;
Fig.11(a)
deviation =
±4.0 kHz, f1 =fi(RF) ± 2 kHz (foffset(min))
generator 1: modulated test signal 1
P1 =Pi(ref) +3dB
fdev
deviation range; Fig.11(a)
deviation =
±2.5 to ±7 kHz; (fdev(min) to fdev(max))
generator 1: modulated test signal 1
P1 =Pi(ref) +3dB
ton
receiver turn-on time; Fig.11(a) note 3
generator 1: modulated test signal 1
P1 =Pi(ref) +10dB
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