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參數(shù)資料
| 型號： | ACTS86HMSR |
| 廠商： | HARRIS SEMICONDUCTOR |
| 元件分類： | 通用總線功能 |
| 英文描述： | Radiation Hardened Quad 2-Input Exclusive OR Gate |
| 中文描述： | ACT SERIES, QUAD 2-INPUT XOR GATE, UUC14 |
| 文件頁數(shù)： | 4/8頁 |
| 文件大小： | 86K |
| 代理商： | ACTS86HMSR |
4
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUP
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test 1 (Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test 2 (Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Interim Test 3 (Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTE:
1. Alternate Group A testing may be exercised in accordance with MIL-STD-883, Method 5005.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE GROUP
METHOD
TEST
READ AND RECORD
PRE RAD
POST RAD
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4 (Note 1)
NOTE:
1. Except FN test which will be performed 100% Go/No-Go.
TABLE 8. BURN-IN TEST CONNECTIONS (+125
o
C < TA < 139
o
C)
OPEN
GROUND
1/2 VCC = 3V
±
0.5V
VCC = 6V
±
0.5V
OSCILLATOR
50kHz
25kHz
STATIC BURN-IN 1 (Note 1)
-
1, 2, 4, 5, 7, 9, 10,
12, 13
3, 6, 8, 11
14
-
-
STATIC BURN-IN 2 (Note 1)
-
7
3, 6, 8, 11
1, 2, 4, 5, 9,
10, 12, 13, 14
-
-
DYNAMIC BURN-IN (Note 1)
-
7
3, 6, 8, 11
14
1, 2, 4, 5, 9,
10, 12, 13
-
NOTE:
1. Each pin except VCC and GND will have a series resistor of 500
±
5%.
TABLE 9. IRRADIATION TEST CONNECTIONS (TA = +25
o
C,
±
5
o
C)
FUNCTION
OPEN
VCC
±
0.5V
Irradiation Circuit (Note 1)
3, 6, 8, 11
7
1, 2, 4, 5, 9, 10, 12, 13, 14
NOTE:
1. Each pin except VCC and GND will have a series resistor of 47k
±
5%. Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures.
Specifications ACTS86MS
Spec Number
518847
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