參數(shù)資料
型號(hào): AD8332ACPZ-R7
廠商: Analog Devices Inc
文件頁數(shù): 13/56頁
文件大?。?/td> 0K
描述: IC AMP VAR GAIN 2CHAN 32-LFCSP
標(biāo)準(zhǔn)包裝: 1
系列: X-AMP®
類型: 可變?cè)鲆娣糯笃?br>
應(yīng)用: 信號(hào)處理
安裝類型: 表面貼裝
封裝/外殼: 32-VFQFN 裸露焊盤,CSP
供應(yīng)商設(shè)備封裝: 32-LFCSP-VQ(5x5)
包裝: 標(biāo)準(zhǔn)包裝
產(chǎn)品目錄頁面: 775 (CN2011-ZH PDF)
配用: AD8332-EVALZ-ND - BOARD EVAL FOR AD8332
其它名稱: AD8332ACPZ-R7DKR
AD8331/AD8332/AD8334
Rev. G | Page 20 of 56
TEST CIRCUITS
MEASUREMENT CONSIDERATIONS
Figure 55 through Figure 68 show typical measurement
configurations and proper interface values for measurements
with 50 Ω conditions.
Short-circuit input noise measurements are made as shown in
Figure 62. The input-referred noise level is determined by
dividing the output noise by the numerical gain between Point A
and Point B and accounting for the noise floor of the spectrum
analyzer. The gain should be measured at each frequency of
interest and with low signal levels because a 50 Ω load is driven
directly. The generator is removed when noise measurements
are made.
0
31
99
-0
55
LMD
18nF
22pF
FB*
120nH
*FERRITE BEAD
IN
OUT
0.1F
DUT
NETWORK ANALYZER
0.1F
28
237
28
1:1
50
270
INH
237
0.1F
Figure 55. Test Circuit—Gain and Bandwidth Measurements
10k
031
99
-05
6
LMD
18nF
22pF
FB*
120nH
*FERRITE BEAD
IN
OUT
0.1F
VGN
DUT
NETWORK ANALYZER
0.1F
28
237
28
1:1
50
INH
237
0.1F
Figure 56. Test Circuit—Frequency Response for Various Matched Source Impedances
03
19
9-
05
7
LMD
22pF
FB*
120nH
*FERRITE BEAD
IN
OUT
0.1F
VGN
DUT
NETWORK ANALYZER
0.1F
28
237
28
1:1
50
INH
237
0.1F
Figure 57. Test Circuit—Frequency Response for Unterminated LNA, RS = 50 Ω
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