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參數(shù)資料
| 型號(hào)： | ADC0831B |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | A/D Peripherals with Serial Control |
| 中文描述： | 具有串行控制的 A/D 外設(shè) |
| 文件頁數(shù)： | 6/9頁 |
| 文件大?。?/td> | 151K |
| 代理商： | ADC0831B |
ADC0831A, ADC0832A, ADC0831B, ADC0832B
A/D PERIPHERALS WITH SERIAL CONTROL
SLAS006 – AUGUST 1985 – REVISED JUNE 1986
6
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
POST OFFICE BOX 1443
HOUSTON, TEXAS 77251–1443
PARAMETER MEASUREMENT INFORMATION
Figure 1. ADC0832 Data Input Timing
50%
tsu
th
tsu
50%
VCC
GND
0.4 V
2 V
DI
0.4 V
CS
CLK
VCC
GND
Figure 2. Data Output Timing
50%
tpd
50%
GND
VOL
VOH
VCC
CLK
DO
VOLTAGE WAVEFORMS
S2 closed
S1 open
10%
90%
tr
VOLTAGE WAVEFORMS
S2 closed
S1 open
DO and SARS
Output
tr
S1
S2
LOAD CIRCUIT
(see Note A)
CL
From Output
Under Test
Test
Point
CS
tdis
90%
10%
90%
50%
VCC
GND
VCC
–VCC
VCC
RL
DO and SARS
Output
tdis
Figure 3. Output Disable Time Test Circuit and Voltage Waveforms
NOTE A: CL includes probe and jig capacitance.
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