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    2. 參數(shù)資料
      型號(hào): ADM489ANZ
      廠商: Analog Devices Inc
      文件頁(yè)數(shù): 4/16頁(yè)
      文件大小: 0K
      描述: IC TXRX RS485 LO SLEW/EN 14DIP
      標(biāo)準(zhǔn)包裝: 25
      類型: 收發(fā)器
      驅(qū)動(dòng)器/接收器數(shù): 1/1
      規(guī)程: RS422,RS485
      電源電壓: 4.5 V ~ 5.5 V
      安裝類型: 通孔
      封裝/外殼: 14-DIP(0.300",7.62mm)
      供應(yīng)商設(shè)備封裝: 14-PDIP
      包裝: 管件
      產(chǎn)品目錄頁(yè)面: 790 (CN2011-ZH PDF)
      ADM488/ADM489
      Rev. D | Page 12 of 16
      300ms
      16ms
      V
      t
      V
      0.2/0.4ms
      t
      5ns
      50ns
      00
      07
      9-
      02
      5
      Figure 25. IEC1000-4-4 Fast Transient Waveform
      Table 8 shows the peak voltages for each of the environments.
      Table 8. Peak Voltages
      Level
      VPEAK (kV) PSU
      VPEAK (kV) I/O
      1
      0.5
      0.25
      2
      1
      0.5
      3
      2
      1
      4
      2
      A simplified circuit diagram of the actual EFT generator is
      shown in Figure 26.
      These transients are coupled onto the signal lines using an EFT
      coupling clamp. The clamp is 1 m long and completely sur-
      rounds the cable, providing maximum coupling capacitance
      (50 pF to 200 pF typical) between the clamp and the cable. High
      energy transients are capacitively coupled onto the signal lines.
      Fast rise times (5 ns), as specified by the standard, result in very
      effective coupling. This test is very severe because high voltages
      are coupled onto the signal lines. The repetitive transients often
      cause problems, while single pulses do not. Destructive latch-up
      can be induced due to the high energy content of the transients.
      Note that this stress is applied while the interface products are
      powered up and transmitting data. The EFT test applies hun-
      dreds of pulses with higher energy than ESD. Worst-case
      transient current on an I/O line can be as high as 40 A.
      RC
      CC
      ZS
      L
      RM CD
      HIGH
      VOLTAGE
      SOURCE
      50
      OUTPUT
      00
      07
      9-
      0
      26
      Figure 26. EFT Generator
      Test results are classified according to the following:
      Normal performance within specification limits.
      Temporary degradation or loss of performance that is self-
      recoverable.
      Temporary degradation or loss of function or performance
      that requires operator intervention or system reset.
      Degradation or loss of function that is not recoverable due
      to damage.
      The ADM488/ADM489 have been tested under worst-case
      conditions using unshielded cables, and meet Classification 2 at
      Severity Level 4. Data transmission during the transient
      condition is corrupted, but it can be resumed immediately
      following the EFT event without user intervention.
      RADIATED IMMUNITY (IEC1000-4-3)
      IEC1000-4-3 (previously IEC801-3) describes the measurement
      method and defines the levels of immunity to radiated electro-
      magnetic fields. It was originally intended to simulate the
      electromagnetic fields generated by portable radio transceivers
      or any other device that generates continuous wave-radiated
      electromagnetic energy. Its scope has been broadened to include
      spurious EM energy, which can be radiated from fluorescent
      lights, thyristor drives, inductive loads, and so on.
      Testing for immunity involves irradiating the device with an
      EM field. Test methods include the use of anechoic chamber,
      stripline cell, TEM cell, and GTEM cell. These consist of two
      parallel plates with an electric field developed between them.
      The device under test is placed between the plates and exposed
      to the electric field. The three severity levels have field strengths
      ranging from 1 V/m to 10 V/m. Results are classified as follows:
      Normal operation.
      Temporary degradation or loss of function that is self-
      recoverable when the interfering signal is removed.
      Temporary degradation or loss of function that requires
      operator intervention or system reset when the interfering
      signal is removed.
      Degradation or loss of function that is not recoverable due
      to damage.
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