參數(shù)資料
型號: ADN2850ACP250
廠商: ANALOG DEVICES INC
元件分類: 數(shù)字電位計
英文描述: TERM,RING NON-INSUL.
中文描述: DUAL 250K DIGITAL POTENTIOMETER, 3-WIRE SERIAL CONTROL INTERFACE, 1024 POSITIONS, QCC16
封裝: 5 X 5 MM, LFCSP-16
文件頁數(shù): 12/18頁
文件大小: 270K
代理商: ADN2850ACP250
PRELIMINARY TECHNICAL DATA
Nonvolatile Memory Programmable Resistors
Note that in the zero-scale condition a finite wiper resistance of
50
is present. Care should be taken to limit the current flow
between W and B in this state to no more than 20mA to avoid
degradation or possible destruction of the internal switches.
ADN2850
REV PrH, 13, AUG 2001
12
The typical distribution of full scale R
WB
from channel-to-
channel matches to ±0.2% within the same package. Device to
device matching is process lot dependent with the worst case of
±30% variation. On the other hand, the change in R
WB
with
temperature has a 35ppm/°C temperature coefficient.
TEST CIRCUITS
Figures 10 to 12 show some of the test conditions used in the
product specification table.
Figure 10. Resistor Position Nonlinearity Error (Rheostat Operation; R-
INL, R-DNL
)
Figure 11. Incremental ON Resistance Test Circuit
Figure 12. Common Mode Leakage current test circuit
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