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ADT7516/ADT7517/ADT7519
FUNCTIONAL DESCRIPTION—MEASUREMENT
Temperature Sensor
The ADT7516/ADT7517/ADT7519 contain an ADC with
special input signal conditioning to enable operation with
external and on-chip diode temperature sensors. When the
ADT7516/ADT7517/ADT7519 is operating in single-channel
mode, the ADC continually processes the measurement taken
on one channel only. This channel is preselected by Bits C0:C2
in the Control Configuration 2 register (Address 19h). When in
round robin mode, the analog input multiplexer sequentially
selects the V
DD
input channel, the on-chip temperature sensor to
measure its internal temperature, either the external temper-
ature sensor or AIN1 and AIN2, AIN3, and then AIN4. These
signals are digitized by the ADC and the results are stored in the
various value registers.
Rev. A | Page 25 of 44
The measured results from the temperature sensors are com-
pared with the internal and external T
HIGH
, T
LOW
limits. These
temperature limits are stored in on-chip registers. If the temp-
erature limits are not masked, any out-of-limit comparisons
generate flags that are stored in the Interrupt Status 1 register.
One or more out-of-limit results will cause the INT/INT output
to pull either high or low depending on the output polarity
setting.
Theoretically, the temperature measuring circuit can measure
temperatures from –128°C to +127°C with a resolution of
0.25°C. However, temperatures outside T
A
are outside the
guaranteed operating temperature range of the device. Temp-
erature measurement from –128°C to +127°C is possible using
an external sensor.
Temperature measurement is initiated by three methods. The
first method is applicable when the part is in single-channel
measurement mode. The temperature is measured 16 times and
internally averaged to reduce noise. In single-channel mode, the
part is continuously monitoring the selected channel, i.e., as
soon as one measurement is taken another one is started on the
same channel. The total time to measure a temperature channel
with the ADC operating at slow speed is typically 11.4 ms
(712 μs × 16) for the internal temperature sensor and 24.22 ms
(1.51 ms × 16) for the external temperature sensor. The new
temperature value is stored in two 8-bit registers and is ready
for reading by the I
2
C or SPI interface. The user has the option
of disabling the averaging by setting Bit 5 in the Control
Configuration 2 register (Address 19h). The ADT7516/
ADT7517/ADT7519 default on power-up with averaging
enabled.
The second method is applicable when the part is in round
robin measurement mode. The part measures both the internal
and external temperature sensors as it cycles through all pos-
sible measurement channels. The two temperature channels are
measured each time the part runs a round robin sequence. In
round robin mode, the part is continuously measuring all
channels.
Temperature measurement is also initiated after every read or
write to the part when the part is in either single-channel
measurement mode or round robin measurement mode.
Once serial communication has started, any conversion in pro-
gress stops and the ADC resets. Conversion restarts immedi-
ately after the serial communication has finished. The temp-
erature measurement proceeds normally as described above.
V
DD
Monitoring
The ADT7516/ADT7517/ADT7519 also have the ability to
monitor its own power supply. The part measures the voltage on
its V
DD
pin to a resolution of 10 bits. The resulting value is
stored in two 8-bit registers; the two LSBs are stored in register
address 03h and the eight MSBs are stored in register address
06h. This allows the option of doing just a 1-byte read if 10-bit
resolution is not important. The measured result is compared
with the V
HIGH
and V
LOW
limits. If the V
DD
interrupt is not
masked, any out-of-limit comparison generates a flag in the
Interrupt Status 2 register and one or more out-of-limit results
will cause the INT/INT output to pull either high or low,
depending on the output polarity setting.
Measuring the voltage on the V
DD
pin is regarded as monitoring
a channel along with the internal, external, and AIN channels.
The user can select the V
DD
channel for single-channel
measurement by setting Bit C4 = 1 and setting Bits C0:C2 to all
0s in the Control Configuration 2 register.
When measuring the V
DD
value, the reference for the ADC is
sourced from the internal reference. Table 8 shows the data
format. As the maximum V
DD
voltage measurable is 7 V, internal
scaling is performed on the V
DD
voltage to match the 2.28 V
internal reference value. Below is an example of how the
transfer function works.
V
DD
= 5 V
ADC Reference
= 2.28 V
1
LSB
=
ADC Reference
/2
10
= 2.28/1024
= 2.226 mV
Scale Factor
=
Full-scale V
CC
/
ADC Reference
= 7/2.28
= 3.07
Conversion Result
=
V
DD
/(
Scale Factor
×
LSB
size
)
= 5/(3.07 × 2.226 mV)
= 2 DCh