參數(shù)資料
型號(hào): AEL4946-0.3072
英文描述: CRYSTAL 0.307200MHZ
中文描述: 水晶0.307200MHZ
文件頁(yè)數(shù): 28/31頁(yè)
文件大小: 226K
代理商: AEL4946-0.3072
SC CUT CRYSTALS: CFPX-2000 SERIES
ISSUE 1; 18 MAY 1998
The CFPX-2000 series of SC cut quartz resonators
are double rotated crystals that offer considerable ad-
vantages over single rotated AT or BT cuts for certain
applications. The term SC stands for “Stress Com-
pensated” and it was the property of compensation for
thermal transient and planar stress effects that was
sought in its orginal development. The frequency/tem-
perature characteristics of the SC cut are most suit-
able for oven controlled oscillator applications for
precision frequency control.
Key Features:
Thermal transient compensation - fast warm up
Low frequency/temperature response slope suitable
for ovened applications
Smooth frequency/temperature characteristics reduce
coupled mode problems
Low thermal hysteresis
Ageing as low as 1 × 10
-10
/day at 85°C (3rd overtone)
can be achieved
Low acceleration sensitivity
Q factor > 1.2 million for 10MHz 3rd overtone crystal
Environmental Specification:
Bump: IEC 68-2-29 Test Eb, 4000 ±10 bumps at
400m/ s
(40
gn
) in each of three mutually perpendicu-
lar planes
Vibration: IEC 68-2-6 Test Fc Procedure B4
(MIL-STD-202 Method 204), Duration 12 hours, 10
to 55Hz 0.75mm D.A., 55 to 2000Hz 98m/s
(10
gn
)
Shock: IEC 68-2-27 Test Ea, (MIL-STD-202
Method 213) sine wave, 981m/s
(100
gn
) 11ms, 6
shocks in each plane
Damp Heat: IEC 68-2-3 Test Ca (Steady State), Du-
ration 56 days, recovery time 12 hours
Change of temperature: IEC 68-2-14 Test Na (Rapid
Change) (MIL-STD-202 Method 107), 10 cycles of
30 mintues duration each for -55/+125°C cycle
Solderability: IEC 68-2-20 Test Ta Method1 (Solder
Bath) (MIL-STD-202 Method 208), Temperature
235°C
Robustness of Termination: IEC 68-2-21 Test Ua
(Tensile or Thrust)(MIL-STD-202 Method 211), 10
Newtons (Tensile) or 20 Newtons (Thrust)
Hermetic Seal: IEC 68-2-17 Test Qk (Fine Leak),
(MIL-STD-202 Method 112 Test condition C) and
IEC 68-2-17 Test Qc (Gross Leak) (MIL-STD-202
Method 112 Test condition D)
Marking: Heat cured epoxy or engraving
Frequency\Holder Range
General Characteristics
Turnover temperature: 50 to 85°C
105 to 125°C
Ageing: < 5 × 10
-9
/day at 85°C (fundamental)
< 1 × 10
-9
/day at 85°C (3rd overtone)
Note: Tighter specifications available
Q - factor: > 1.2 million for 10MHz 3rd overtone
g - sensitivity: < 1 × 10
-9
/g typical for HC35, HC37 or
HC40
Note: These holders employ 4-point mounting and are
recommended where low g - sensitivity is a requirement
Material: Swept premium Q, low inclusion density
To determine your exact requirements please contact
our Applications Support Department
EuropeTel:+44(0)146074433
Fax:+44(0)146072578
28
Americas Tel:+19199410430
Fax:+19199410530
Q
C
Frequency
Range
Mode
Holder
IEC Code
8.0 to 50.0MHz
Fundamental
HC35/U (TO5)
HC45/U
DK
EB
30.0to150.0MHz
3rd Overtone
5.0 to 20.0MHz
Fundamental
HC37/U (TO8)
DL
8.0 to 20.0MHz
3rd Overtone
1.5 to 10.0MHz
Fundamental
HC40/U
HC36/U
DU, DM, DR
DN
4.0 to 20.0MHz
3rd Overtone
&
&
' / *
++ * "
&
&
Outline in mm (inches) - HC35/U (TO5) DK -
(scale 1.5:1)
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