參數(shù)資料
型號: AM29BDD160GT54DKK
廠商: ADVANCED MICRO DEVICES INC
元件分類: PROM
英文描述: 16 Megabit (1 M x 16-bit/512 K x 32-Bit), CMOS 2.5 Volt-only Burst Mode, Dual Boot, Simultaneous Read/Write Flash Memory
中文描述: 512K X 32 FLASH 2.7V PROM, 54 ns, PQFP80
封裝: LEAD FREE, PLASTIC, QFP-80
文件頁數(shù): 34/80頁
文件大?。?/td> 3476K
代理商: AM29BDD160GT54DKK
2
Am29BDD160G
GENERAL DESCRIPTION
The Am29BDD160 is a 16 Megabit, 2.5 Volt-only sin-
gle power supply burst mode flash memory device.
The device can be configured for either 1,048,576
words in 16-bit mode or 524,288 double words in
32-bit mode. The device can also be programmed in
standard EPROM programmers. The device offers a
configurable burst interface to 16/32-bit micropro-
cessors and microcontrollers.
To eliminate bus contention, each device has sepa-
rate chip enable (CE#), write enable (WE#) and
output enable (OE#) controls. Additional control in-
puts are required for synchronous burst operations:
Load Burst Address Valid (ADV#), and Clock (CLK).
Each device requires only a single 2.5 or 2.6
Volt power supply (2.5 V to 2.75 V) for both
read and write functions. A 12.0-volt V
PP is not
required for program or erase operations, al-
though an acceleration pin is available if faster
programming performance is required.
The device is entirely command set compatible with
the JEDEC single-power-supply Flash standard.
The software command set is compatible with the
command sets of the 5 V Am29F and 3 V Am29LV
Flash families. Commands are written to the com-
mand register using standard microprocessor write
timing. Register contents serve as inputs to an inter-
nal state-machine that controls the erase and
programming circuitry. Write cycles also internally
latch addresses and data needed for the program-
ming and erase operations. Reading data out of the
device is similar to reading from other Flash or
EPROM devices.
The Unlock Bypass mode facilitates faster pro-
gramming times by requiring only two write cycles to
program data instead of four.
The Simultaneous Read/Write architecture pro-
vides simultaneous operation by dividing the
memory space into two banks. The device can begin
programming or erasing in one bank, and then si-
multaneously read from the other bank, with zero
latency. This releases the system from waiting for
the completion of program or erase operations. See
Simultaneous Read/Write Operations Overview and
Restrictions on page 13.
The device provides a 256-byte SecSi (Secured
Silicon) Sector with an one-time-programmable
(OTP) mechanism.
In addition, the device features several levels of sec-
tor protection, which can disable both the program
and erase operations in certain sectors or sector
groups: Persistent Sector Protection is a com-
mand sector protection method that replaces the old
12 V controlled protection method; Password Sec-
tor Protection is a highly sophisticated protection
method that requires a password before changes to
certain sectors or sector groups are permitted; WP#
Hardware Protection prevents program or erase in
the two outermost 8 Kbytes sectors of the larger
bank.
The device defaults to the Persistent Sector Protec-
tion mode. The customer must then choose if the
Standard or Password Protection method is most de-
sirable. The WP# Hardware Protection feature is
always available, independent of the other protection
method chosen.
The Versatile I/O (V
CCQ) feature allows the
output voltage generated on the device to be
determined based on the V
IO level. This feature
allows this device to operate in the 1.8 V I/O
environment, driving and receiving signals to
and from other 1.8 V devices on the same bus.
In addition, inputs and I/Os that are driven ex-
ternally are capable of handling 3.6 V.
The host system can detect whether a program or
erase operation is complete by observing the RY/BY#
pin, by reading the DQ7 (Data# Polling), or DQ6
(toggle) status bits. After a program or erase cycle
has been completed, the device is ready to read
array data or accept another command.
The sector erase architecture allows memory sec-
tors to be erased and reprogrammed without
affecting the data contents of other sectors. The de-
vice is fully erased when shipped from the factory.
Hardware data protection measures include
a low V
CC detector that automatically inhibits
write operations during power transitions. The
password and software sector protection
feature disables both program and erase opera-
tions in any combination of sectors of memory.
This can be achieved in-system at V
CC level.
The Program/Erase Suspend/Erase Resume
feature enables the user to put erase on hold for any
period of time to read data from, or program data to,
any sector that is not selected for erasure. True
background erase can thus be achieved.
The hardware RESET# pin terminates any opera-
tion in progress and resets the internal state
machine to reading array data.
The device offers two power-saving features. When
addresses have been stable for a specified amount of
time, the device enters the automatic sleep mode.
The system can also place the device into the
standby mode. Power consumption is greatly re-
duced in both these modes.
AMD’s Flash technology combines years of Flash
memory manufacturing experience to produce the
highest levels of quality, reliability and cost effective-
ness. The device electrically erases all bits within a
sector simultaneously via Fowler-Nordheim tunnel-
ling. The data is programmed using hot electron
injection.
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