參數(shù)資料
型號: AM29DS323DB110EIN
廠商: Advanced Micro Devices, Inc.
英文描述: 32 Megabit (4 M x 8-Bit/2 M x 16-Bit) CMOS 1.8 Volt-only, Simultaneous Operation Flash Memory
中文描述: 32兆位(4個M × 8位/ 2米x 16位),1.8伏的CMOS只,同時作業(yè)快閃記憶體
文件頁數(shù): 47/54頁
文件大小: 1013K
代理商: AM29DS323DB110EIN
50
Am29DS323D
P R E L I M I NARY
ERASE AND PROGRAMMING PERFORMANCE
Notes:
1. Typical program and erase times assume the following conditions: 25
°C, 2.0 V V
CC, 1,000,000 cycles. Additionally,
programming typicals assume checkerboard pattern.
2. Under worst case conditions of 90
°C, V
CC = 2.2 V, 1,000,000 cycles.
3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes
program faster than the maximum program times listed.
4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure.
5. System-level overhead is the time required to execute the two- or four-bus-cycle sequence for the program command. See Table
14 for further information on command definitions.
6. The device has a minimum erase and program cycle endurance of 1,000,000 cycles.
LATCHUP CHARACTERISTICS
Note: Includes all pins except V
CC. Test conditions: VCC = 2.0 V, one pin at a time.
DATA RETENTION
Parameter
Unit
Comments
Sector Erase Time
2
15
sec
Excludes 00h programming
prior to erasure (Note 4)
Chip Erase Time
130
sec
Byte Program Time
9
270
s
Excludes system level
overhead (Note 5)
Word Program Time
13
390
s
Accelerated Byte/Word Program Time
7
210
s
Chip Program Time
Byte Mode
54
160
sec
Word Mode
27
81
Description
Min
Max
Input voltage with respect to V
SS on all pins except I/O pins
(including A9, OE#, and RESET#)
–1.0 V
11 V
Input voltage with respect to V
SS on all I/O pins
–1.0 V
V
CC + 1.0 V
V
CC Current
–100 mA
+100 mA
Parameter Description
Test Conditions
Min
Unit
Minimum Pattern Data Retention Time
150
°C
10
Years
125
°C
20
Years
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