參數(shù)資料
型號(hào): AM29F016D-150EI
廠商: ADVANCED MICRO DEVICES INC
元件分類: PROM
英文描述: 16 Megabit (2 M x 8-Bit) CMOS 5.0 Volt-only, Uniform Sector Flash Memory
中文描述: 2M X 8 FLASH 5V PROM, 150 ns, PDSO48
封裝: MO-142DD, TSOP-48
文件頁(yè)數(shù): 44/45頁(yè)
文件大?。?/td> 1145K
代理商: AM29F016D-150EI
43
Am29F016D
REVISION SUMMARY
Revision A (May 1997)
Initial release of Am29F016B (0.35 μm) device.
Revision B (January 1998)
Global
Made formatting and layout consistent with other data
sheets. Used updated common tables and diagrams.
Revision B+1 (January 1998)
AC Characteristics—Read-only Operations
Deleted note referring to output driver disable time.
Figure 16—Temporary Sector Group Unprotect
Timings
Corrected title to indicate “sector group.”
Revision B+2 (April 1998)
Global
Added -70 speed option, deleted -75 speed option.
Distinctive Characteristics
Changed minimum 100K write/erase cycles guaran-
teed to 1,000,000.
Ordering Information
Added extended temperature availability to -90, -120,
and -150 speed options.
Operating Ranges
Added extended temperature range.
DC Characteristics, CMOS Compatible
Corrected the CE# and RESET# test conditions for
I
CC3
and I
CC4
to V
CC
±0.5 V.
AC Characteristics
Erase/Program Operations; Erase and Program Oper-
ations Alternate CE# Controlled Writes:
Corrected the
notes reference for t
WHWH1
and t
WHWH2
. These param-
eters are 100% tested. Corrected the note reference for
t
VCS
. This parameter is not 100% tested.
Temporary Sector Unprotect Table
Added note reference for t
VIDR
. This parameter is not
100% tested.
Erase and Programming Performance
Changed minimum 100K program and erase cycles
guaranteed to 1,000,000.
Revision C (January 1999)
Global
Updated for CS39S process technology.
Distinctive Characteristics
Added:
I
20-year data retention at 125
°
C
— Reliable operation for the life of the system
DC Characteristics—CMOS Compatible
I
CC3
, I
CC4
: Added Note 4, “For CMOS mode only I
CC3
,
I
CC4
= 20 μA at extended temperature (>+85°C)”.
DC Characteristics—TTL/NMOS Compatible and
CMOS Compatible
I
CC1
, I
CC2
, I
CC3
, I
CC4
: Added Note 2 “Maximum I
CC
specifications are tested with V
CC
= V
CCmax
”.
I
CC3
,
I
CC4
: Deleted V
CC
= V
CC
Max.
Revision C+1 (March 23, 1999)
Operating Ranges
The temperature ranges are now specified as ambient.
Revision C+2 (May 17, 1999)
Product Selector Guide
Corrected the t
OE
specification for the -150 speed op-
tion to 55 ns.
Operating Ranges
V
CC
Supply Voltages
: Added “V
CC
for ± 5% devices .
+4.75 V to +5.25 V”.
Revision C+3 (July 2, 1999)
Global
Added references to availability of device in Known
Good Die (KGD) form.
Revision D (November 16, 1999)
AC Characteristics—Figure 11. Program
Operations Timing and Figure 12. Chip/Sector
Erase Operations
Deleted t
GHWL
and changed OE# waveform to start at
high.
Physical Dimensions
Replaced figures with more detailed illustrations.
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