參數(shù)資料
型號(hào): AM29F016D-90F4E
廠商: ADVANCED MICRO DEVICES INC
元件分類: PROM
英文描述: LM137/LM337 3-Terminal Adjustable Negative Regulators; Package: TO-220; No of Pins: 3; Qty per Container: 45; Container: Rail
中文描述: 2M X 8 FLASH 5V PROM, 90 ns, PDSO40
封裝: REVERSE, MO-142CD, TSOP-40
文件頁(yè)數(shù): 4/45頁(yè)
文件大小: 1145K
代理商: AM29F016D-90F4E
Am29F016D
3
TABLE OF CONTENTS
Product Selector Guide. . . . . . . . . . . . . . . . . . . . . 4
Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
Connection Diagrams . . . . . . . . . . . . . . . . . . . . . . 5
Pin Configuration. . . . . . . . . . . . . . . . . . . . . . . . . . 7
Logic Symbol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Ordering Information. . . . . . . . . . . . . . . . . . . . . . . 8
Device Bus Operations . . . . . . . . . . . . . . . . . . . . . 9
Table 1. Am29F016D Device Bus Operations.................................. 9
Requirements for Reading Array Data ..................................... 9
Writing Commands/Command Sequences .............................. 9
Program and Erase Operation Status .................................... 10
Standby Mode ........................................................................ 10
RESET#: Hardware Reset Pin ............................................... 10
Output Disable Mode.............................................................. 10
Table 2. Sector Address Table........................................................ 11
Autoselect Mode..................................................................... 12
Table 3. Am29F016D Autoselect Codes (High Voltage Method).... 12
Sector Group Protection/Unprotection.................................... 12
Table 4. Sector Group Addresses................................................... 12
Temporary Sector Group Unprotect ....................................... 12
Figure 1. Temporary Sector Group Unprotect Operation................ 13
Hardware Data Protection...................................................... 13
Low V
CC
Write Inhibit...................................................................... 13
Write Pulse “Glitch” Protection........................................................ 13
Logical Inhibit.................................................................................. 13
Power-Up Write Inhibit.................................................................... 13
Common Flash Memory Interface (CFI). . . . . . . 14
Table 5. CFI Query Identification String.......................................... 14
Table 6. System Interface String..................................................... 14
Table 7. Device Geometry Definition .............................................. 15
Table 8. Primary Vendor-Specific Extended Query ........................ 15
Command Definitions . . . . . . . . . . . . . . . . . . . . . 16
Reading Array Data................................................................ 16
Reset Command..................................................................... 16
Autoselect Command Sequence............................................ 16
Byte Program Command Sequence....................................... 16
Unlock Bypass Command Sequence.............................................. 17
Figure 2. Program Operation .......................................................... 17
Chip Erase Command Sequence........................................... 17
Sector Erase Command Sequence........................................ 18
Erase Suspend/Erase Resume Commands........................... 18
Figure 3. Erase Operation............................................................... 19
Command Definitions............................................................. 20
Table 9. Am29F016D Command Definitions................................... 20
Write Operation Status . . . . . . . . . . . . . . . . . . . . 21
DQ7: Data# Polling................................................................. 21
Figure 4. Data# Polling Algorithm ................................................... 21
RY/BY#: Ready/Busy# ........................................................... 22
DQ6: Toggle Bit I.................................................................... 22
DQ2: Toggle Bit II................................................................... 22
Reading Toggle Bits DQ6/DQ2 .............................................. 22
DQ5: Exceeded Timing Limits................................................ 23
DQ3: Sector Erase Timer ....................................................... 23
Figure 5. Toggle Bit Algorithm........................................................ 23
Table 10. Write Operation Status................................................... 24
Absolute Maximum Ratings. . . . . . . . . . . . . . . . . 25
Figure 6. Maximum Negative Overshoot Waveform...................... 25
Figure 7. Maximum Positive Overshoot Waveform........................ 25
Operating Ranges. . . . . . . . . . . . . . . . . . . . . . . . . 25
DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 26
TTL/NMOS Compatible .......................................................... 26
CMOS Compatible.................................................................. 26
Test Conditions. . . . . . . . . . . . . . . . . . . . . . . . . . . 27
Figure 8. Test Setup...................................................................... 27
Table 11. Test Specifications......................................................... 27
Key to Switching Waveforms. . . . . . . . . . . . . . . . 27
AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 28
Read-only Operations............................................................. 28
Figure 9. Read Operation Timings................................................. 28
Figure 10. RESET# Timings .......................................................... 29
Erase/Program Operations..................................................... 30
Figure 11. Program Operation Timings.......................................... 31
Figure 12. Chip/Sector Erase Operation Timings .......................... 32
Figure 13. Data# Polling Timings (During Embedded Algorithms). 33
Figure 14. Toggle Bit Timings (During Embedded Algorithms)...... 33
Figure 15. DQ2 vs. DQ6................................................................. 34
Figure 16. Temporary Sector Group Unprotect Timings................ 34
Erase and Program Operations.............................................. 35
Alternate CE# Controlled Writes.................................................... 35
Figure 17. Alternate CE# Controlled Write Operation Timings ...... 36
Erase and Programming Performance . . . . . . . 37
Latchup Characteristics. . . . . . . . . . . . . . . . . . . . 37
TSOP and SO Pin Capacitance . . . . . . . . . . . . . . 37
Data Retention. . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Physical Dimensions . . . . . . . . . . . . . . . . . . . . . . 38
TS 040—40-Pin Standard Thin Small Outline Package......... 38
TSR040—40-Pin Reverse Thin Small Outline Package......... 39
TS 048—48-Pin Standard Thin Small Outline Package......... 40
TSR048—48-Pin Reverse Thin Small Outline Package......... 41
SO 044—44-Pin Small Outline Package................................ 42
Revision Summary . . . . . . . . . . . . . . . . . . . . . . . . 43
Revision A (May 1997) ........................................................... 43
Revision B (January 1998) ..................................................... 43
Revision B+1 (January 1998)................................................. 43
Revision B+2 (April 1998)....................................................... 43
Revision C (January 1999)..................................................... 43
Revision C+1 (March 23, 1999).............................................. 43
Revision C+2 (May 17, 1999)................................................. 43
Revision C+3 (July 2, 1999) ................................................... 43
Revision D (November 16, 1999) ........................................... 43
Revision E (May 19, 2000) ..................................................... 44
Revision E+1 (December 4, 2000) ......................................... 44
Revision E+2 (March 23, 2001).............................................. 44
相關(guān)PDF資料
PDF描述
AM29F016D-90F4I 16 Megabit (2 M x 8-Bit) CMOS 5.0 Volt-only, Uniform Sector Flash Memory
AM29F016D-90FC 16 Megabit (2 M x 8-Bit) CMOS 5.0 Volt-only, Uniform Sector Flash Memory
AM29F016D-90FE 16 Megabit (2 M x 8-Bit) CMOS 5.0 Volt-only, Uniform Sector Flash Memory
Am29F016D-90FEB LM138/LM338 5-Amp Adjustable Regulators; Package: TO-220; No of Pins: 3; Qty per Container: 45; Container: Rail
AM29F016D-90FI 16 Megabit (2 M x 8-Bit) CMOS 5.0 Volt-only, Uniform Sector Flash Memory
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
AM29F016D-90SD 制造商:Spansion 功能描述:IC 16M (2M X 8-BIT)5V SECTOR
AM29F016D-90SF 功能描述:閃存 16M (2MX8) 90ns 5v Parallel NOR 閃存 RoHS:否 制造商:ON Semiconductor 數(shù)據(jù)總線寬度:1 bit 存儲(chǔ)類型:Flash 存儲(chǔ)容量:2 MB 結(jié)構(gòu):256 K x 8 定時(shí)類型: 接口類型:SPI 訪問(wèn)時(shí)間: 電源電壓-最大:3.6 V 電源電壓-最小:2.3 V 最大工作電流:15 mA 工作溫度:- 40 C to + 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體: 封裝:Reel
AM29F016D-90SF\T 功能描述:閃存 16M (2MX8) 90ns 5v Parallel NOR 閃存 RoHS:否 制造商:ON Semiconductor 數(shù)據(jù)總線寬度:1 bit 存儲(chǔ)類型:Flash 存儲(chǔ)容量:2 MB 結(jié)構(gòu):256 K x 8 定時(shí)類型: 接口類型:SPI 訪問(wèn)時(shí)間: 電源電壓-最大:3.6 V 電源電壓-最小:2.3 V 最大工作電流:15 mA 工作溫度:- 40 C to + 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體: 封裝:Reel
AM29F016D-90SI 制造商:Spansion 功能描述:NOR Flash Parallel 5V 16Mbit 2M x 8bit 90ns 44-Pin SO
AM29F016D-90SI\T 制造商:Spansion 功能描述:NOR Flash Parallel 5V 16Mbit 2M x 8bit 90ns 44-Pin SOIC T/R