參數(shù)資料
型號: AM29F200T-150EE
英文描述: x8/x16 Flash EEPROM
中文描述: x8/x16閃存EEPROM
文件頁數(shù): 24/39頁
文件大小: 728K
代理商: AM29F200T-150EE
24
Am29F002B/Am29F002NB
TEST CONDITIONS
Table 7.
Test Specifications
KEY TO SWITCHING WAVEFORMS
2.7 k
C
L
6.2 k
5.0 V
Device
Under
Test
Figure 8.
Test Setup
Note:
Diodes are IN3064 or equivalent
Test Condition
-55
All
others
Unit
Output Load
1 TTL gate
Output Load Capacitance, C
L
(including jig capacitance)
30
100
pF
Input Rise and Fall Times
5
20
ns
Input Pulse Levels
0.0–3.0
0.45–2.4
V
Input timing measurement
reference levels
1.5
0.8, 2.0
V
Output timing measurement
reference levels
1.5
0.8, 2.0
V
WAVEFORM
INPUTS
OUTPUTS
Steady
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High Z)
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