參數(shù)資料
型號: AM29LV160MB90PCI
廠商: ADVANCED MICRO DEVICES INC
元件分類: PROM
英文描述: 16 Megabit (2 M x 8-Bit/1 M x 16-Bit) MirrorBit TM 3.0 Volt-only Boot Sector Flash Memory
中文描述: 1M X 16 FLASH 3V PROM, 90 ns, PBGA64
封裝: 13 X 11 MM, 1 MM PITCH, FORTIFIED, BGA-64
文件頁數(shù): 55/63頁
文件大?。?/td> 967K
代理商: AM29LV160MB90PCI
January31,2007 25974B5
Am29LV160M
53
D a t a S h e e t
Erase and Programming Performance
Notes:
1.
Typical program and erase times assume the following conditions: 25
°
C, V
CC
= 3.0V, 100,000 cycles. Additionally,
programming typicals assume checkerboard pattern.
Under worst case conditions of 90°C, V
CC
= 2.7 V, 100,000 cycles.
The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes
program faster than the maximum program times listed.
In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure.
System-level overhead is the time required to execute the two- or four-bus-cycle sequence for the program command. See
Table 10, on page 31
and
Table 11, on page 32
for further information on command definitions.
The device has a minimum erase and program cycle endurance of 100,000 cycles.
2.
3.
4.
5.
6.
Latchup Characteristics
Note:
Includes all pins except V
CC
. Test conditions: V
CC
= 3.0 V, one pin at a time.
TSOP Pin and BGA Package Capacitance
Notes:
1.
2.
Sampled, not 100% tested.
Test conditions T
A
= 25°C, f = 1.0 MHz.
Data Retention
Parameter
Typ ( Note 1)
Max ( Note 2)
Unit
Comments
Sector Erase Time
0.7
15
sec
Excludes 00h programming prior to
erasure (Note 4)
Chip Erase Time
32
Byte Programming Time
18
300
μs
Excludes system level overhead
(Note 5)
Word Programming Time
18
300
Chip Programming Time
(Note 3)
Byte Mode
36
100
sec
Word Mode
19
66
Description
Min
Max
Input voltage with respect to V
on all pins except I/O pins
(including A9, OE#, and RESET#)
–1.0 V
12.5 V
Input voltage with respect to V
SS
on all I/O pins
–1.0 V
V
CC
+ 1.0 V
V
CC
Current
–100 mA
+ 100 mA
Parameter Symbol
Parameter Description
Test Setup
Typ
Max
Unit
C
IN
Input Capacitance
V
IN
= 0
TSOP
6
7.5
pF
Fine-pitch BGA
4.2
5.0
pF
C
OUT
Output Capacitance
V
OUT
= 0
TSOP
8.5
12
pF
Fine-pitch BGA
5.4
6.5
pF
C
IN2
Control Pin Capacitance
V
IN
= 0
TSOP
7.5
9
pF
Fine-pitch BGA
3.9
4.7
pF
Parameter
Test Conditions
Min
Unit
Minimum Pattern Data Retention Time
150
°
C
10
Years
125
°
C
20
Years
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