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AMP01
WAFER TEST LIMITS
(@ V
S
=
6
15 V, R
S
= 10 k
V
, R
L
= 2 k
V
, T
A
= +25
8
C, unless otherwise noted)
–6–
REV. D
AMP01NBC
Limit
AMP01GBC
Limit
Parameter
Symbol Conditions
Units
μ
V max
mV max
dB min
dB min
dB min
dB min
dB min
dB min
dB min
dB min
dB min
dB min
nA max
nA max
V min
dB min
dB min
dB min
dB min
dB min
Input Offset Voltage
Output Offset Voltage
Offset Referred to Input
vs. Positive Supply
V
IOS
V
OOS
PSR
60
4
120
8
V+ = +5 V to +15 V
G = 1000
G = 100
G = 10
G = 1
V– = –5 V to –15 V
G = 1000
G = 100
G = 10
G = 1
120
110
95
75
110
100
90
70
Offset Referred to Input
vs. Negative Supply
PSR
105
90
70
50
4
1
±
10
105
90
70
50
8
3
±
10
Input Bias Current
Input Offset Current
Input Voltage Range
Common Mode Rejection
I
B
I
OS
IVR
CMR
Guaranteed by CMR Tests
V
CM
=
±
10 V
G = 1000
G = 100
G = 10
G = 1
125
120
100
85
115
110
95
75
Gain Equation Accuracy
G
=
20
×
R
S
R
G
0.6
0.8
% max
Output Voltage Swing
V
OUT
V
OUT
V
OUT
R
L
= 2 k
R
L
= 500
R
L
= 50
Output to Ground Short
Output to Ground Short
+V Linked to +V
OP
–V Linked to –V
OP
±
13
±
13
±
2.5
±
60
±
120
4.8
4.8
±
13
±
13
±
2.5
±
60
±
120
4.8
4.8
V min
V min
V min
mA min
mA max
mA max
mA max
Output Current Limit
Output Current Limit
Quiescent Current
I
Q
NOTE
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.
V
NULL
R
GAIN
R
SCALE
V
OOS
NULL
R1
47.5k
V
R2
2.5k
V
R4
2.5k
V
R3
47.5k
V
A1
A3
A2
Q1
Q2
250
V
250
V
–IN
+IN
REFERENCE
V+
+V
OP
OUTPUT
–V
OP
SENSE
V–
Figure 1. Simplified Schematic
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AMP01 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE