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參數(shù)資料
| 型號： | AN-24 |
| 廠商： | Electronic Theatre Controls, Inc. |
| 英文描述： | A Simplified Test Set for Op Amp Characterization |
| 中文描述： | 一種簡化的測試設(shè)置運算放大器表征 |
| 文件頁數(shù)： | 1/10頁 |
| 文件大?。?/td> | 412K |
| 代理商： | AN-24 |
TL/H/7190
A
A
National Semiconductor
Application Note 24
M. Yamatake
April 1986
A Simplified Test Set for Op
Amp Characterization
INTRODUCTION
The test set described in this paper allows complete quanti-
tative characterization of all dc operational amplifier param-
eters quickly and with a minimum of additional equipment.
The method used is accurate and is equally suitable for lab-
oratory or production testDfor quantitative readout or for
limit testing. As embodied here, the test set is conditioned
for testing the LM709 and LM101 amplifiers; however, sim-
ple changes discussed in the text will allow testing of any of
the generally available operational amplifiers.
Amplifier parameters are tested over the full range of com-
mon mode and power supply voltages with either of two
output loads. Test set sensitivity and stability are adequate
for testing all presently available integrated amplifiers.
The paper will be divided into two sections, i.e., a functional
description, and a discussion of circuit operation. Complete
construction information will be given including a layout for
the tester circuit boards.
FUNCTIONAL DESCRIPTION
The test set operates in one of three basic modes. These
are: (1) Bias Current Test; (2) Offset Voltage, Offset Current
Test; and (3) Transfer Function Test. In the first two of these
tests, the amplifier under test is exercised throughout its full
common mode range. In all three tests, power supply volt-
ages for the circuit under test may be set at
g
5V,
g
10V,
g
15V, or
g
20V.
POWER SUPPLY
Basic waveforms and dc operating voltages for the test set
are derived from a power supply section comprising a posi-
tive and a negative rectifier and filter, a test set voltage
regulator, a test circuit voltage regulator, and a function gen-
erator. The dc supplies will be discussed in the section deal-
ing with detailed circuit description.
The waveform generator provides three output functions, a
g
19V square wave, a
b
19V to
a
19V pulse with a 1% duty
cycle, and a
g
5V triangular wave. The square wave is the
basic waveform from which both the pulse and triangular
wave outputs are derived.
The square wave generator is an operational amplifier con-
nected as an astable multivibrator. This amplifier provides
an output of approximately
g
19V at 16 Hz. This square
wave is used to drive junction FET switches in the test set
and to generate the pulse and triangular waveforms.
The pulse generator is a monostable multivibrator driven by
the output of the square wave generator. This multivibrator
is allowed to swing from negative saturation to positive satu-
ration on the positive going edge of the square wave input
and has a time constant which will provide a duty cycle of
approximately 1%. The output is approximately
b
19V to
a
19V.
TL/H/7190–1
FIGURE 1. Functional Diagram of Bias Current Test Circuit
C
1995 National Semiconductor Corporation
RRD-B30M115/Printed in U. S. A.
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