
6
ALLIANCE SEMICONDUCTOR
10/6/00
AS6WA5128
Data retention characteristics (over the operating range)
13,5
Parameter
V
CC
for data retention
Data retention current
Data retention waveform
AC test loads and waveforms
Notes
1
2
3
4
5
6
7
8
9
10 CS or WE must be HIGH during address transitions. Either CS or WE asserting high terminates a write cycle.
11 All write cycle timings are referenced from the last valid address to the first transitioning address.
12 N/A.
13 1.2V data retention applies to commercial and industrial temperature range operations.
14 C = 30pF, except at high Z and low Z parameters, where C = 5pF.
During V
CC
power-up, a pull-up resistor to V
CC
on CS is required to meet I
SB
specification.
This parameter is sampled, but not 100% tested.
For test conditions, see
AC Test Conditions
.
t
CLZ
and t
CHZ
are specified with C
L
= 5pF as in Figure C. Transition is measured ±500 mV from steady-state voltage.
This parameter is guaranteed, but not tested.
WE is HIGH for read cycle.
CS and OE are LOW for read cycle.
Address valid prior to or coincident with CS transition LOW.
All read cycle timings are referenced from the last valid address to the first transitioning address.
Symbol
V
DR
I
CCDR
t
CDR
t
R
Test conditions
Min
1.2V
Max
3.6
Unit
V
V
CC
= 1.2V
CS
≥
V
CC
– 0.1V or
V
IN
≥
V
CC
– 0.1V or
V
IN
≤
0.1V
–
4
mA
Chip deselect to data retention time
Operation recovery time
0
–
–
t
RC
ns
Parameters
V
CC
= 3.0V
1105
V
CC
= 2.5V
16670
V
CC
= 2.0V
15294
Unit
R1
Ohms
R2
R
TH
V
TH
1550
645
15380
8000
11300
6500
Ohms
Ohms
1.75V
1.2V
0.85V
Volts
V
CC
CS
t
R
t
CDR
Data retention mode
V
CC
V
CC
V
DR
≥
1.2V
V
IH
V
IH
V
DR
V
CC
R1
R2
OUTPUT
30 pF
INCLUDING
JIG AND
SCOPE
(a)
V
CC
R1
R2
OUTPUT
5 pF
ALL INPUT PULSES
(b)
10%
90%
10%
90%
GND
V
CC
Typ
< 5 ns
(c)
Thevenin equivalent:
OUTPUT
R
TH
V
INCLUDING
JIG AND
SCOPE