參數(shù)資料
型號: ATMEGA128-16MI
廠商: Atmel
文件頁數(shù): 8/24頁
文件大小: 0K
描述: IC AVR MCU 128K 16MHZ IND 64-QFN
產(chǎn)品培訓(xùn)模塊: megaAVR Introduction
標(biāo)準(zhǔn)包裝: 260
系列: AVR® ATmega
核心處理器: AVR
芯體尺寸: 8-位
速度: 16MHz
連通性: EBI/EMI,I²C,SPI,UART/USART
外圍設(shè)備: 欠壓檢測/復(fù)位,POR,PWM,WDT
輸入/輸出數(shù): 53
程序存儲(chǔ)器容量: 128KB(64K x 16)
程序存儲(chǔ)器類型: 閃存
EEPROM 大小: 4K x 8
RAM 容量: 4K x 8
電壓 - 電源 (Vcc/Vdd): 4.5 V ~ 5.5 V
數(shù)據(jù)轉(zhuǎn)換器: A/D 8x10b
振蕩器型: 內(nèi)部
工作溫度: -40°C ~ 85°C
封裝/外殼: 64-VFQFN 裸露焊盤
包裝: 托盤
配用: ATSTK501-ND - ADAPTER KIT FOR 64PIN AVR MCU
16
2467XS–AVR–06/11
ATmega128
SEI
; set global interrupt enable
4.
Stabilizing time needed when changing OSCCAL Register
After increasing the source clock frequency more than 2% with settings in the OSCCAL reg-
ister, the device may execute some of the subsequent instructions incorrectly.
Problem Fix / Workaround
The behavior follows errata number 3., and the same Fix / Workaround is applicable on this
errata.
5.
IDCODE masks data from TDI input
The JTAG instruction IDCODE is not working correctly. Data to succeeding devices are
replaced by all-ones during Update-DR.
Problem Fix / Workaround
If ATmega128 is the only device in the scan chain, the problem is not visible.
Select the Device ID Register of the ATmega128 by issuing the IDCODE instruction
or by entering the Test-Logic-Reset state of the TAP controller to read out the
contents of its Device ID Register and possibly data from succeeding devices of the
scan chain. Issue the BYPASS instruction to the ATmega128 while reading the
Device ID Registers of preceding devices of the boundary scan chain.
If the Device IDs of all devices in the boundary scan chain must be captured
simultaneously, the ATmega128 must be the fist device in the chain.
6.
Reading EEPROM by using ST or STS to set EERE bit triggers unexpected interrupt
request.
Reading EEPROM by using the ST or STS command to set the EERE bit in the EECR reg-
ister triggers an unexpected EEPROM interrupt request.
Problem Fix / Workaround
Always use OUT or SBI to set EERE in EECR.
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