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參數(shù)資料
| 型號(hào)： | BTF1A |
| 英文描述： | Dual Differential Transceiver BTF1A With Idle Bus Indicator |
| 中文描述： | 雙差分收發(fā)器BTF1A有空閑巴士指標(biāo) |
| 文件頁數(shù)： | 13/16頁 |
| 文件大?。?/td> | 252K |
| 代理商： | BTF1A |
Agere Systems Inc.
13
Data Sheet
March 2001
With Idle Bus Indicator
Dual Differential Transceiver BTF1A
Latch Up
Latch up evaluation has been performed on the data transmission receivers. Latch up testing determines if the
power-supply current exceeds the specified maximum due to the application of a stress to the device under test. A
device is considered susceptible to latch up if the power supply current exceeds the maximum level and remains at
that level after the stress is removed.
Lucent performs latch up testing per an internal test method which is consistent with JEDEC Standard No. 17 (pre-
viously JC-40.2)
CMOS Latch Up Standardized Test Procedure
Latch up evaluation involves three separate stresses to evaluate latch up susceptibility levels:
1. dc current stressing of input and output pins.
2. Power supply slew rate.
3. Power supply overvoltage.
Table 10. Latch Up Test Criteria and Test Results
dc Current Stress
of I/O Pins
≥
150 mA
Power Supply
Slew Rate
≤
1
μs
Power Supply
Overvoltage
≥
1.75 x Vmax
Data Transmission
Receiver ICs
Minimum Criteria
Test Results
≥
250 mA
≤
100 ns
≥
2.25 x Vmax
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