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| 型號： | C515 |
| 廠商： | INFINEON TECHNOLOGIES AG |
| 元件分類： | 8位微控制器 |
| 英文描述： | 8-Bit CMOS Microcontroller |
| 中文描述： | 8位CMOS微控制器 |
| 文件頁數(shù)： | 44/55頁 |
| 文件大?。?/td> | 287K |
| 代理商： | C515 |
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C515
Semiconductor Group
44
1997-08-01
A/D Converter Characteristics
V
CC
= 5 V
+
10%, – 15%;
V
SS
= 0
V
T
A
= 0 to 70
°
C
T
A
= – 40 to 85
°
C
T
A
= – 40 to 110
°
C
for the SAB-C515-1RM
for the SAF-C515-1RM
for the SAH-C515-1RM
V
CC
– 0.25 V
≤
V
AREF
≤
V
CC
+
0.25
V
;
V
SS
– 0.2 V
≤
V
AGND
≤
V
ss
+ 0.2 V;
V
IntAREF
V
IntAGND
≥
1 V;
Notes:
1) V
AIN
may exceed V
AGND
or V
AREF
up to the absolute maximum ratings. However, the conversion result in
these cases will be 00
H
or FF
H
, respectively.
2) During the sample time the input capacitance
C
AIN
can be charged/discharged by the external source. The
internal resistance of the analog source must allow the capacitance to reach their final voltage level within t
S
.
After the end of the sample time t
S
, changes of the analog input voltage have no effect on the conversion
result.
3) This parameter includes the sample time t
S
and the conversion time t
C
. The values for the conversion clock
t
ADC
is always 8 x t
IN
.
4) T
UE
is tested at V
AREF
= 5.0 V, V
AGND
= 0 V, V
CC
= 4.9 V. It is guaranteed by design characterization for all
other voltages within the defined voltage range.
If an overload condition occurs on maximum 2 not selected analog input pins and the absolute sum of input
overload currents on all analog input pins does not exceed 10 mA, an additional conversion error of 1/2 LSB
is permissible.
5) During the conversion the ADC’s capacitance must be repeatedly charged or discharged. The internal
resistance of the reference source must allow the capacitance to reach their final voltage level within the
indicated time. The maximum internal resistance results from the programmed conversion timing.
6) Not 100% tested, but guaranteed by design characterization.
Parameter
Symbol
Limit Values
Unit
Test Condition
min.
V
AGND
-
0.2
max.
V
AREF
+
0.2
2 x
t
CLCL
16 x
t
IN
80 x
t
IN
±
1
Analog input voltage
V
AIN
V
1)
A/D converter input clock
t
IN
t
S
t
ADCC
T
UE
–
ns
Sample time
–
ns
2)
Conversion cycle time
–
ns
3)
Total unadjusted error
–
LSB
V
IntAREF
=
V
AREF
= V
CC
V
IntAGND
=
V
AGND
= V
SS
4)
t
IN
in [ns]
5) 6)
Internal resistance of
reference voltage source
R
AREF
–
8 x
t
IN
/500
- 1
t
S
/ 500 - 1
k
Internal resistance of
analog source
R
ASRC
–
k
t
S
in [ns]
2) 6)
ADC input capacitance
C
AIN
–
45
pF
6)
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