參數(shù)資料
型號(hào): CAT5113VI-10-G
元件分類: 數(shù)字電位計(jì)
英文描述: 100-Tap Digitally Programmable Potentiometer (DPP⑩)
中文描述: 100抽頭數(shù)字可編程電位(民進(jìn)黨⑩)
文件頁(yè)數(shù): 3/13頁(yè)
文件大?。?/td> 287K
代理商: CAT5113VI-10-G
CAT5113
2007 Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
3
Doc. No. MD-2009 Rev. T
OPERATION MODES
INC
ˉˉ
Low
Low
U/D
High
Low
X
X
X
Operation
Wiper toward H
Wiper toward L
Store Wiper Position
No Store, Return to Standby
Standby
High to Low
High to Low
High
Low
X
Low to High
Low to High
High
ABSOLUTE MAXIMUM RATINGS
(1)
Parameters
Supply Voltage
V
CC
to GND
Inputs
ˉˉ to GND
ˉˉˉ to GND
U/D to GND
H to GND
L to GND
W to GND
Ratings
-0.5 to +7V
-0.5 to V
CC
+0.5
-0.5 to V
CC
+0.5
-0.5 to V
CC
+0.5
-0.5 to V
CC
+0.5
-0.5 to V
CC
+0.5
-0.5 to V
CC
+0.5
Units
V
V
V
V
V
V
V
Parameters
Operating Ambient Temperature
Commercial (‘C’ or Blank suffix)
Industrial (‘I’ suffix)
Junction Temperature
Storage Temperature
Lead Soldering (10s max)
Ratings
0 to 70
-40 to +85
+150
-65 to 150
+300
Units
oC
oC
oC
oC
oC
RELIABILITY CHARACTERISTICS
Symbol
V
ZAP
I
LTH
T
DR
N
END
Parameter
ESD Susceptibility MIL-STD-883, Test Method 3015
Latch-Up
JEDEC Standard 17
Data Retention
MIL-STD-883, Test Method 1008
Endurance
MIL-STD-883, Test Method 1003
Test Method
Min
2000
100
100
1,000,000
Typ
Max
Units
V
mA
Years
Stores
(2)
(2) (3)
DC ELECTRICAL CHARACTERISTICS
V
CC
= +2.5V to +6V unless otherwise specified
Power Supply
Symbol
V
CC
Parameter
Operating Voltage Range
Conditions
V
CC
= 6V, f = 1MHz, I
W
= 0
V
CC
= 6V, f = 250kHz, I
W
= 0
Programming, V
CC
= 6V
V
CC
= 3V
ˉˉ = V
CC
- 0.3V
U/D, ˉˉˉ
= V
CC
- 0.3V or GND
Min
2.5
Typ
Max
6.0
100
50
1000
500
Units
V
μA
μA
μA
μA
I
CC1
Supply Current (Increment)
I
CC2
Supply Current (Write)
I
SB1
(3)
Supply Current (Standby)
0.01
1
μA
Notes:
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this
specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.
(2) This parameter is tested initially and after a design or process change that affects the parameter.
(3) Latch-up protection is provided for stresses up to 100mA on address and data pins from -1V to V
CC
+ 1V
(4) I
W
= source or sink
(5) These parameters are periodically sampled and are not 100% tested.
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