參數(shù)資料
型號： CAT5114R00TE13
元件分類： 數(shù)字電位計
英文描述： 32-Tap Digitally Programmable Potentiometer
中文描述： 32抽頭數(shù)字可編程電位器
文件頁數(shù)： 3/7頁
文件大?。?/td> 61K
代理商： CAT5114R00TE13
CAT5112
3
Doc. No. 2002, Rev. L
Power Supply
Symbol
V
CC
I
CC1
Parameter
Operating Voltage Range
Supply Current (Increment)
Conditions
Min
2.5
—
—
—
—
Typ
—
—
—
—
—
Max
6.0
200
100
1
500
Units
V
μ
A
V
CC
= 6V, f = 1MHz, I
W
=0
V
CC
= 6V, f = 250kHz, I
W
=0
Programming, V
CC
= 6V
V
CC
= 3V
CS=V
CC
-0.3V
U/D, INC=V
CC
-0.3V or GND
I
CC2
Supply Current (Write)
mA
μ
A
μ
A
ISB
1 (2)
Supply Current (Standby)
—
75
150
OPERATING MODES
ABSOLUTE MAXIMUM RATINGS
Supply Voltage
V
CC
to GND
Inputs
CS
to GND
INC
to GND
U/
D
to GND
R
H
to GND
R
L
to GND
R
WB
to GND
-0.5V to +7V
-0.5V to V
CC
+0.5V
-0.5V to V
CC
+0.5V
-0.5V to V
CC
+0.5V
-0.5V to V
CC
+0.5V
-0.5V to V
CC
+0.5V
-0.5V to V
CC
+0.5V
Operating Ambient Temperature
Commercial (
‘
C
’
or Blank suffix)
Industrial (
‘
I
’
suffix)
Junction Temperature
Storage Temperature
Lead Soldering (10 sec max)
0
°
C to +70
°
C
-40
°
C to +85
°
C
+150
°
C
-65
°
C to +150
°
C
+300
°
C
* Stresses above those listed under Absolute Maximum Ratings may
cause permanent damage to the device. Absolute Maximum Ratings
are limited values applied individually while other parameters are
within specified operating conditions, and functional operation at any
of these conditions is NOT implied. Device performance and reliability
may be impaired by exposure to absolute rating conditions for extended
periods of time.
NOTES:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) Latch-up protection is provided for stresses up to 100mA on address and data pins from
–
1V to V
CC
+ 1V
(3) I
=source or sink
(4) These parameters are periodically sampled and are not 100% tested.
R
L
C
L
C
H
R
H
C
W
R
WB
R
wi
Potentiometer
Equivalent Circuit
INC
High to Low
High to Low
High
Low
X
CS
Low
Low
Low to High
Low to High
High
U/D
High
Low
X
X
X
Operation
Wiper toward H
Wiper toward L
Store Wiper Position
No Store, Return to Standby
Standby
RELIABILITY CHARACTERISTICS
Symbol
Parameter
Test Method
Min
Typ
Max
Units
V
ZAP(1)
I
LTH(1)(2)
T
DR
N
END
ESD Susceptibility
Latch-Up
Data Retention
Endurance
MIL-STD-883, Test Method 3015
JEDEC Standard 17
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 1003
2000
100
100
1,000,000
Volts
mA
Years
Stores
DC Electrical Characteristics: V
CC
= +2.5V to +6.0V unless otherwise specified
Symbol
Parameter
Conditions
Min
Typ
Max
Units
I
IH
I
IL
V
IH1
V
IL1
V
IH2
V
IL2
Input Leakage Current
Input Leakage Current
TTL High Level Input Voltage
TTL Low Level Input Voltage
CMOS High Level Input Voltage
CMOS Low Level Input Voltage
V
IN
= V
CC
V
IN
= 0V
4.5V
≤
V
CC
≤
5.5V
—
—
2
0
—
—
—
—
—
—
10
–
10
V
CC
0.8
μ
A
μ
A
V
V
V
V
2.5V
≤
V
CC
≤
6V
V
CC
x 0.7
-0.3
V
CC
+ 0.3
V
CC
x 0.2
Logic Inputs
相關PDF資料
PDF描述
CAT5114R10TE13 32-Tap Digitally Programmable Potentiometer
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相關代理商/技術參數(shù)
參數(shù)描述
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