CAT93C56, CAT93C57
Doc. No. MD-1088 Rev. P
4
Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
A.C. CHARACTERISTICS
(1)
, CAT93C56, Die Rev. G – New Product
V
CC
= +1.8V to +5.5V, T
A
= -40°C to +85°C, unless otherwise specified.
Limits
Symbol
Parameter
Min
50
0
100
100
0.25
0.25
0.25
DC
Max
0.25
0.25
100
5
0.25
2000
Units
t
CSS
t
CSH
t
DIS
t
DIH
t
PD1
t
PD0
t
HZ
t
EW
t
CSMIN
t
SKHI
t
SKLOW
t
SV
SK
MAX
CS Setup Time
CS Hold Time
DI Setup Time
DI Hold Time
Output Delay to 1
Output Delay to 0
Output Delay to High-Z
Program/Erase Pulse Width
Minimum CS Low Time
Minimum SK High Time
Minimum SK Low Time
Output Delay to Status Valid
Maximum Clock Frequency
ns
ns
ns
ns
μs
μs
ns
ms
μs
μs
μs
μs
kHz
(2)
A.C. CHARACTERISTICS
(1)
, CAT93C56/57, Die Rev. E – Mature Product
(CAT93C56 Rev. E - NOT RECOMMENDED FOR NEW DESIGNS)
Limits
V
CC
= 1.8V - 5.5V
Min
200
0
400
400
1
1
1
DC
V
CC
= 2.5V - 5.5V
Min
100
0
200
200
0.5
0.5
0.5
DC
V
CC
= 4.5V - 5.5V
Min
50
0
100
100
0.25
0.25
0.25
DC
Symbol
Parameter
Max
1
1
400
10
1
250
Max
0.5
0.5
200
10
0.5
500
Max
0.25
0.25
100
10
0.25
1000
Units
t
CSS
t
CSH
t
DIS
t
DIH
t
PD1
t
PD0
t
HZ
t
EW
t
CSMIN
t
SKHI
t
SKLOW
t
SV
SK
MAX
CS Setup Time
CS Hold Time
DI Setup Time
DI Hold Time
Output Delay to 1
Output Delay to 0
Output Delay to High-Z
Program/Erase Pulse Width
Minimum CS Low Time
Minimum SK High Time
Minimum SK Low Time
Output Delay to Status Valid
Maximum Clock Frequency
ns
ns
ns
ns
μs
μs
ns
ms
μs
μs
μs
μs
kHz
(2)
Notes
:
(1) Test conditions according to “A.C. Test Conditions” table.
(2) These parameters are tested initially and after a design or process change that affects the parameter according to appropriate
AEC-Q100 and JEDEC test methods.