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參數資料
| 型號： | CAT93C56ZD4IT3E |
| 元件分類： | EEPROM |
| 英文描述： | The CAT24FC02 is a 2-kb Serial CMOS EEPROM internally organized as 256 words of 8 bits each |
| 中文描述： | 該CAT24FC02是一個2 KB的EEPROM的國內256個8位每字舉辦的串行CMOS |
| 文件頁數： | 2/9頁 |
| 文件大?。?/td> | 420K |
| 代理商： | CAT93C56ZD4IT3E |
2
CAT93C56/57
Doc. No. 1088, Rev. O
D.C. OPERATING CHARACTERISTICS
V
CC
= +1.8V to +5.5V, unless otherwise specified.
Symbol
Parameter
Test Conditions
Min
Typ
Max
Units
I
CC1
Power Supply Current
(Write)
f
SK
= 1MHz
V
CC
= 5.0V
3
mA
I
CC2
Power Supply Current
(Read)
f
SK
= 1MHz
V
CC
= 5.0V
500
μ
A
I
SB1
Power Supply Current
(Standby) (x8 Mode)
CS = 0V
ORG=GND
10
μ
A
I
SB2
Power Supply Current
(Standby) (x16Mode)
CS=0V
0
10
μ
A
ORG=Float or V
CC
I
LI
Input Leakage Current
V
IN
= 0V to V
CC
1
μ
A
μ
A
I
LO
Output Leakage Current
(Including ORG pin)
V
OUT
= 0V to V
CC
,
CS = 0V
1
V
IL1
Input Low Voltage
4.5V
≤
V
CC
< 5.5V
4.5V
≤
V
CC
< 5.5V
1.8V
≤
V
CC
< 4.5V
1.8V
≤
V
CC
< 4.5V
4.5V
≤
V
CC
< 5.5V
I
OL
= 2.1mA
4.5V
≤
V
CC
< 5.5V
I
OH
= -400
μ
A
1.8V
≤
V
CC
< 4.5V
I
OL
= 1mA
1.8V
≤
V
CC
< 4.5V
I
OH
= -100
μ
A
-0.1
0.8
V
V
IH1
Input High Voltage
2
V
CC
+ 1
V
V
IL2
Input Low Voltage
0
V
CC
x 0.2
V
V
IH2
Input High Voltage
V
CC
x 0.7
V
CC
+1
V
V
OL1
Output Low Voltage
0.4
V
V
OH1
Output High Voltage
2.4
V
V
OL2
Output Low Voltage
0.2
V
V
OH2
Output High Voltage
V
CC
- 0.2
V
ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias .................. -55
°
C to +125
°
C
Storage Temperature........................ -65
°
C to +150
°
C
Voltage on any Pin with
Respect to Ground
(1)
............. -2.0V to +V
CC
+2.0V
V
CC
with Respect to Ground ................ -2.0V to +7.0V
Package Power Dissipation
Capability (T
A
= 25
°
C) ................................... 1.0W
Lead Soldering Temperature (10 secs) ............ 300
°
C
Output Short Circuit Current
(2)
........................ 100 mA
RELIABILITY CHARACTERISTICS
*COMMENT
Stresses above those listed under
“
Absolute Maximum
Ratings
”
may cause permanent damage to the device.
These are stress ratings only, and functional operation of
the device at these or any other conditions outside of those
listed in the operational sections of this specification is not
implied. Exposure to any absolute maximum rating for
extended periods may affect device performance and
reliability.
Symbol
N
END(3)
Parameter
Reference Test Method
Min
Typ
Max
Units
Endurance
MIL-STD-883, Test Method 1033
1,000,000
Cycles/Byte
T
DR(3)
Data Retention
MIL-STD-883, Test Method 1008
100
Years
V
ZAP(3)
ESD Susceptibility
MIL-STD-883, Test Method 3015
2000
Volts
I
LTH(3)(4)
Latch-Up
JEDEC Standard 17
100
mA
Note:
(1) The minimum DC input voltage is
–
0.5V. During transitions, inputs may undershoot to
–
2.0V for periods of less than 20 ns. Maximum DC
voltage on output pins is V
CC
+0.5V, which may overshoot to V
CC
+2.0V for periods of less than 20 ns.
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) This parameter is tested initially and after a design or process change that affects the parameter.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from
–
1V to V
CC
+1V.
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