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| 型號： | CL8282ATC100-3 |
| 英文描述： | ASIC |
| 中文描述： | 專用集成電路 |
| 文件頁數(shù)： | 11/12頁 |
| 文件大?。?/td> | 115K |
| 代理商： | CL8282ATC100-3 |
CL8282A Laser-Configured ASIC
Page 11
Ordering Information
1. During transitions, inputs may undershoot to -2.0V for periods shorter than
20ns. Otherwise, minimum DC input voltage is -0.3V.
2. The following devices do not have V
CCIO
pins: CL8282A, CL8452A. For these
devices, all references to V
CCIO
should be changed to V
CCINT
3. Typical values are at V
CC
of 5.0 volts and ambient temperature of 25 oC.
4. Guaranteed but not tested. Characterized initially, and after any design changes
which may affect these parameters.
5. Internal timing delays are based on characterization, and cannot be explicitly
tested. Internal timing parameters should be used for performance estimation
only.
6. Use AC Test Conditions set-up B for these parameters.
16 Jan. 1998:
31 Jul. 1999:
29 Nov. 1999:
01 Dec. 2000:
Created new document
Recompiled databook, 8820 package update.
Remove reference to the 8282AV device which is not supported.
Review and reprint.
AC Test Conditions
464
250
35 pF
V
CCIO
OUTPUT
Includes jig
capacitance
464
250
5 pF
V
CCIO
OUTPUT
Includes jig
capacitance
(A)
(B)
≤
3ns
≤
3ns
3.0V
90%
10%
GND
90%
10%
All Input Pulses
8K drw 01
Notes to Tables
Revision History
Part Number
Temperature Range
Package Type
Speed
Altera Equivalent
CL8282ALC84-4
Commercial
84-pin PLCC
-4 (slowest)
EPF8282ALC84-4
CL8282ALC84-3
-3
EPF8282ALC84-3
CL8282ALC84-2
-2 (fastest)
EPF8282ALC84-2
CL8282ATC100-4
100-pin Plastic TQFP
-4 (slowest)
EPF8282ATC100-4
CL8282ATC100-3
-3
EPF8282ATC100-3
CL8282ATC100-2
-2 (fastest)
EPF8282ATC100-2
CL8282ALI84-4
Industrial
84-pin PLCC
-4
EPF8282ALI84-4
CL8282ATI100-3
100-pin TQFP
-3
EPF8282ATI100-3
8282A tble 02
A: Test fixture set-up A is for general testing.
B: Test fixture set-up B is for high Z testing (t
ZX#
).
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