參數(shù)資料
型號(hào): CLH1005B-3N3K-S
廠商: YAGEO CORP
元件分類: 通用定值電感
英文描述: 1 ELEMENT, 0.0033 uH, CERAMIC-CORE, GENERAL PURPOSE INDUCTOR, SMD
封裝: CHIP, 0402, ROHS COMPLIANT
文件頁(yè)數(shù): 3/11頁(yè)
文件大?。?/td> 176K
代理商: CLH1005B-3N3K-S
CLH SERIES RELIABILITY TEST
1-1 MECHANICAL PERFORMANCE
NO.
ITEM
SPECIFICATION
TEST CONDITIONS
1-1-1
Flexure Strength
Appearance : No Damage
Test device shall be soldered on the substrate.
L Change : within
10%
Substrate Dimension : 100 x 40 x 1.6mm
Q Change : within
30%
Deflection : 2.0mm
Keeping Time : 30Sec.
* For 100505, substrate dimension is 100 x 40 x 0.8mm.
1-1-2
Vibration
Test device shall be soldered on the substrate.
Oscillation Frequency : 10 to 55 to 10Hz for 1Min.
Amplitude : 1.5mm
Time : 2Hrs. for each Axis (X,Y & Z), Total 6Hrs.
1-1-3
Resistance to
Appearance : No Damage
Pre-heating : 150 C, 1Min.
Soldering Heat
Solder Composition : Sn/Pb = 63/37
Solder Temperature : 260
5 C
Immersion Time : 10
1Sec.
1-1-4
Solderability
The electrodes shall be at least 90% covered
Pre-heating : 150 C, 1Min.
with new solder coating.
Solder Composition : Sn/Pb = 63/37
Solder Temperature : 230
5 C
Immersion Time : 4
1Sec.
45
20
2
1.6
1-2 ENVIRONMENTAL PERFORMANCE
NO.
ITEM
SPECIFICATION
TEST CONDITIONS
1-2-1
Temperature Cycle
Appearance : No Damage
One Cycle
L Change : within
10%
Step
Temperature ( C)
Time (Min.)
Q Change : within
30%
1
-25
330
2
25
23
3
85
330
4
25
23
Total : 100 Cycles
Measured after Exposure in the Room Condition for 24Hrs.
1-2-2
Humidity Resistance
Temperature : 40
2 C
Relative Humidity : 90 ~ 95%
Time : 1000Hrs.
Measured after Exposure in the Room Condition for 24Hrs.
1-2-3
High Temperature
Temperature : 85
3 C
Resistance
Relative Humidity : 20%
Applied Current : Rated Current
Time : 1000Hrs.
Measured after Exposure in the Room Condition for 24Hrs.
1-2-4
Low Temperature
Temperature : -25
3 C
Resistance
Relative Humidity : 0%
Time : 1000Hrs.
Measured after Exposure in the Room Condition for 24Hrs.
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