參數(shù)資料
型號: CY7C1061AV33-12ZXI
廠商: CYPRESS SEMICONDUCTOR CORP
元件分類: DRAM
英文描述: 16-Mbit (1M x 16) Static RAM
中文描述: 1M X 16 STANDARD SRAM, 12 ns, PDSO54
封裝: LEAD FREE, TSOP2-54
文件頁數(shù): 4/10頁
文件大?。?/td> 566K
代理商: CY7C1061AV33-12ZXI
CY7C1061AV33
Document #: 38-05256 Rev. *G
Page 4 of 10
Notes
6. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified
I
/I
and specified transmission line loads. Test conditions for the Read cycle use output loading shown in (a) of the
“AC Test Loads and Waveforms
” on
page 3
, unless specified otherwise.
7. This part has a voltage regulator that steps down the voltage from 3V to 2V internally. t
time must be provided initially before a Read/Write operation is started.
8. t
, t
, t
, t
HZBE
and t
, t
, t
, t
are specified with a load capacitance of 5 pF as in (b) of
“AC Test Loads and Waveforms
” on page 3
.
Transition is measured
200 mV from steady-state voltage.
9. These parameters are guaranteed by design and are not tested.
10.The internal Write time of the memory is defined by the overlap of CE
LOW (CE
HIGH) and WE LOW. Chip enables must be active and WE and byte enables
must be LOW to initiate a Write, and the transition of any of these signals can terminate the Write. The input data setup and hold timing should be referenced to
the leading edge of the signal that terminates the Write.
11. The minimum Write cycle time for Write Cycle No. 2 (WE controlled, OE LOW) is the sum of t
HZWE
and t
SD
.
AC Switching Characteristics
(Over the Operating Range)
[6]
Parameter
Description
–10
–12
Unit
Min
Max
Min
Max
Read Cycle
t
power
t
RC
t
AA
t
OHA
t
ACE
t
DOE
t
LZOE
t
HZOE
t
LZCE
t
HZCE
t
PU
t
PD
t
DBE
t
LZBE
t
HZBE
Write Cycle
[10, 11]
V
CC
(typical) to the first access
[7]
Read Cycle Time
1
1
ms
10
12
ns
Address to Data Valid
10
12
ns
Data Hold from Address Change
3
3
ns
CE
1
LOW/CE
2
HIGH to Data Valid
OE LOW to Data Valid
10
12
ns
5
6
ns
OE LOW to Low-Z
OE HIGH to High-Z
[8]
CE
1
LOW/CE
2
HIGH to Low-Z
[8]
CE
1
HIGH/CE
2
LOW to High-Z
[8]
CE
1
LOW/CE
2
HIGH to Power Up
[9]
CE
1
HIGH/CE
2
LOW to Power Down
[9]
Byte Enable to Data Valid
1
1
ns
5
6
ns
3
3
ns
5
6
ns
0
0
ns
10
12
ns
5
6
ns
Byte Enable to Low-Z
1
1
ns
Byte Disable to High-Z
5
6
ns
t
WC
t
SCE
t
AW
t
HA
t
SA
t
PWE
t
SD
t
HD
t
LZWE
t
HZWE
t
BW
Write Cycle Time
10
12
ns
CE
1
LOW/CE
2
HIGH to Write End
Address Setup to Write End
7
8
ns
7
8
ns
Address Hold from Write End
0
0
ns
Address Setup to Write Start
0
0
ns
WE Pulse Width
7
8
ns
Data Setup to Write End
5.5
6
ns
Data Hold from Write End
WE HIGH to Low-Z
[8]
WE LOW to High-Z
[8]
0
0
ns
3
3
ns
5
6
ns
Byte Enable to End of Write
7
8
ns
[+] Feedback
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