參數(shù)資料
型號: DAC8043FP
廠商: PRECISION MONOLITHICS INC
元件分類: DAC
英文描述: 12-Bit Serial Input Multiplying CMOS D/A Converter
中文描述: SERIAL INPUT LOADING, 0.25 us SETTLING TIME, 12-BIT DAC, PDIP8
文件頁數(shù): 4/12頁
文件大?。?/td> 189K
代理商: DAC8043FP
DAC8043
WAFER TEST LIMTS
@ V
DD
=
+
5 V, V
REF
= +10 V; I
OUT
= GND = 0 V, T
A
= +25
8
C.
–4–
REV. C
DAC8043GBC
Limit
Parameter
Symbol
Conditions
Units
ST AT IC ACCURACY
Resolution
Integral Nonlinearity
Differential Nonlinearity
Gain Error
Power Supply Rejection Ratio
Output Leakage Current (I
OUT
)
REFERENCE INPUT
Input Resistance
DIGIT AL INPUT S
Digital Input HIGH
Digital Input LOW
Input Leakage Current
POWER SUPPLY
Supply Current
N
INL
DNL
G
FSE
PSRR
I
LK G
12
±
1
±
1
±
2
±
0.002
±
5
Bits min
LSB max
LSB max
LSB max
%/% max
nA max
Using Internal Feedback Resistor
V
DD
=
±
5%
Digital Inputs = V
IL
R
IN
7/15
k
min/max
V
IH
V
IL
I
IL
2.4
0.8
±
1
V min
V max
μ
A max
V
IN
= 0 V to V
DD
I
DD
Digital Inputs = V
IN
or V
IL
Digital Inputs = 0 V or V
DD
500
100
μ
A max
μ
A max
NOT E
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualifications through sample lot assembly and testing.
DICE CHARACT E RIST ICS
DIE SIZE 0.116
×
0.109 inch, 12,644 sq. mils (2.95
×
2.77 mm, 8.17 sq. mm)
1. V
REF
2. R
FB
3. I
OUT
4. GND
5.
LD
6. SRI
7. CLK
8. V
DD
Substate (die backside) is internally connected to V
DD
.
WARNING!
ESD SENSITIVE DEVICE
C AUT ION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the DAC8043 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. T herefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
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