
Signals and Package Information
56F826 Technical Data, Rev. 14
Freescale Semiconductor
13
RD
26
Output
Read Enable
—RD is asserted during external memory read cycles. When RD is
asserted low, pins D0–D15 become inputs and an external device is enabled
onto the device data bus. When RD is deasserted high, the external data is
latched inside the device. When RD is asserted, it qualifies the A0–A15, PS, and
DS pins. RD can be connected directly to the OE pin of a Static RAM or ROM.
WR
27
Output
Write Enable
—WR is asserted during external memory write cycles. When WR
is asserted low, pins D0–D15 become outputs and the device puts data on the
bus. When WR is deasserted high, the external data is latched inside the
external device. When WR is asserted, it qualifies the A0–A15, PS, and DS pins.
WR can be connected directly to the WE pin of a Static RAM.
TA0
(GPIOF0)
91
Input/Output
Input/Output
TA0–3
—Timer A Channels 0, 1, 2, and 3
Port F GPIO
—These four General Purpose I/O (GPIO) pins can be individually
programmed as input or output.
After reset, the default state is Quad Timer.
TA1
(GPIOF1)
90
TA2
(GPIOF2)
89
TA3
(GPIOF3)
88
TCK
100
Input
(Schmitt)
Test Clock Input
—This input pin provides a gated clock to synchronize the test
logic and shift serial data to the JTAG/OnCE port. The pin is connected internally
to a pull-down resistor.
TMS
1
Input
(Schmitt)
Test Mode Select Input
—This input pin is used to sequence the JTAG TAP
controller’s state machine. It is sampled on the rising edge of TCK and has an
on-chip pull-up resistor.
Note:
Always tie the TMS pin to V
DD
through a 2.2K resistor.
TDI
2
Input
(Schmitt)
Test Data Input
—This input pin provides a serial input data stream to the
JTAG/OnCE port. It is sampled on the rising edge of TCK and has an on-chip
pull-up resistor.
TDO
3
Output
Test Data Output
—This tri-statable output pin provides a serial output data
stream from the JTAG/OnCE port. It is driven in the Shift-IR and Shift-DR
controller states, and changes on the falling edge of TCK.
TRST
4
Input
(Schmitt)
Test Reset
—As an input, a low signal on this pin provides a reset signal to the
JTAG TAP controller. To ensure complete hardware reset, TRST should be
asserted whenever RESET is asserted. The only exception occurs in a
debugging environment when a hardware device reset is required and it is
necessary not to reset the JTAG/OnCE module. In this case, assert RESET, but
do not assert TRST. TRST must always be asserted at power-up.
Note:
in a debugging environment, TRST may be tied to V
SS
through a 1K resistor.
For normal operation, connect TRST directly to V
SS
. If the design is to be used
DE
98
Output
Debug Event
—DE provides a low pulse on recognized debug events.
Table 2-1 56F826 Signal and Package Information for the 100 Pin LQFP (Continued)
Signal
Name
Pin No.
Type
Description