參數(shù)資料
型號: DV102011
廠商: Microchip Technology
文件頁數(shù): 11/12頁
文件大?。?/td> 0K
描述: DEV KIT TOUCH SCREEN 7" 4-WIRE
產(chǎn)品培訓模塊: 8-bit PIC® Microcontroller Portfolio
特色產(chǎn)品: AR1000 Touch Screen Controllers
標準包裝: 1
系列: AR1000
傳感器類型: 觸摸屏幕
電源電壓: 3.3V,5V
嵌入式:
已供物品: 板,線纜,CD,PICkit? 串行分析器,觸控屏
已用 IC / 零件: AR1000
產(chǎn)品目錄頁面: 685 (CN2011-ZH PDF)
相關產(chǎn)品: RSA-.10RCT-ND - RES .10 OHM 1W 1% WW AXIAL
RSA-.10RTR-ND - RES .10 OHM 1W 1% WW AXIAL
RSA-.10CT-ND - RES .10 OHM 1W 1% WW AXIAL
RSA-.10TR-ND - RES .10 OHM 1W 1% WW AXIAL
74LVC1G97
All information provided in this document is subject to legal disclaimers.
NXP B.V. 2011. All rights reserved.
Product data sheet
Rev. 3 — 7 December 2011
8 of 20
NXP Semiconductors
74LVC1G97
Low-power configurable multiple function gate
Table 10.
Measurement points
Supply voltage
Input
Output
VCC
VM
VI
VM
1.65 V to 1.95 V
0.5VCC
VCC
0.5VCC
2.3 V to 2.7 V
0.5VCC
VCC
0.5VCC
2.7 V
1.5 V
2.7 V
1.5 V
3.0Vto 3.6V
1.5V
2.7 V
1.5V
4.5 V to 5.5 V
0.5VCC
VCC
0.5VCC
Measurement points are given in Table 11.
Definitions test circuit:
RL = Load resistance.
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
VEXT = External voltage for measuring switching times.
Fig 13. Test circuit for measuring switching times
VEXT
VCC
VI
VO
mna616
DUT
CL
RT
RL
G
Table 11.
Measurement points
Supply voltage
Input
Load
VEXT
VCC
VI
tr =tf
CL
RL
tPLH, tPHL
1.65 V to 1.95 V
VCC
2.0ns
30pF
1k
open
2.3to2.7V
VCC
2.0ns
30pF
500
open
2.7V
2.5ns
50pF
500
open
3.0Vto 3.6V
2.7V
2.5ns
50pF
500
open
4.5 V to 5.5 V
VCC
2.5ns
50pF
500
open
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