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參數(shù)資料
| 型號： | EH1100ETTS-34.560M |
| 廠商： | ECLIPTEK CORP |
| 元件分類： | XO, clock |
| 英文描述： | CRYSTAL OSCILLATOR, CLOCK, 34.56 MHz, HCMOS/TTL OUTPUT |
| 封裝： | ROHS COMPLIANT, METAL, DIP-14/4 |
| 文件頁數(shù)： | 1/7頁 |
| 文件大?。?/td> | 145K |
| 代理商： | EH1100ETTS-34.560M |
Pb
RoHS
EH1100ETTS-34.560M
EH11 00
ET
TS -34.560M
Series
RoHS Compliant (Pb-free) 5.0V 14 Pin DIP Metal
Thru-Hole HCMOS/TTL High Frequency Oscillator
Frequency Tolerance/Stability
±100ppm Maximum
Package
Operating Temperature Range
-40°C to +85°C
Nominal Frequency
34.560MHz
Pin 1 Connection
Tri-State (High Impedance)
Duty Cycle
50 ±10(%)
ELECTRICAL SPECIFICATIONS
Nominal Frequency
34.560MHz
Frequency Tolerance/Stability
±100ppm Maximum (Inclusive of all conditions: Calibration Tolerance at 25°C, Frequency Stability over the
Operation Temperature Range, Supply Voltage Change, Output Load Change, 1st Year Aging at 25°C,
Shock, and Vibration)
Aging at 25°C
±5ppm/year Maximum
Operating Temperature Range
-40°C to +85°C
Supply Voltage
5.0Vdc ±10%
Input Current
50mA Maximum (No Load)
Output Voltage Logic High (Voh)
2.4Vdc Minimum with TTL Load, Vdd-0.4Vdc Minimum with HCMOS Load (IOH = -16mA)
Output Voltage Logic Low (Vol)
0.4Vdc Maximum with TTL Load, 0.5Vdc Maximum with HCMOS Load (IOL = +16mA)
Rise/Fall Time
6nSec Maximum (Measured at 0.8Vdc to 2.0Vdc with TTL Load, 20% to 80% of waveform with HCMOS
Load)
Duty Cycle
50 ±10(%) (Measured at 1.4Vdc with TTL Load or at 50% of wavform with HCMOS Load)
Load Drive Capability
10TTL Load or 50pF HCMOS Load Maximum
Output Logic Type
CMOS
Pin 1 Connection
Tri-State (High Impedance)
Tri-State Input Voltage (Vih and Vil)
+2.2Vdc Minimum to enable output, +0.8Vdc Maximum to disable output (High Impedance), No Connect to
enable output.
Absolute Clock Jitter
±250pSec Maximum, ±100pSec Typical
One Sigma Clock Period Jitter
±50pSec Maximum, ±30pSec Typical
Start Up Time
10mSec Maximum
Storage Temperature Range
-55°C to +125°C
ENVIRONMENTAL & MECHANICAL SPECIFICATIONS
Fine Leak Test
MIL-STD-883, Method 1014, Condition A
Gross Leak Test
MIL-STD-883, Method 1014, Condition C
Lead Integrity
MIL-STD-883, Method 2004
Mechanical Shock
MIL-STD-202, Method 213, Condition C
Resistance to Soldering Heat
MIL-STD-202, Method 210
Resistance to Solvents
MIL-STD-202, Method 215
Solderability
MIL-STD-883, Method 2003
Temperature Cycling
MIL-STD-883, Method 1010
Vibration
MIL-STD-883, Method 2007, Condition A
www.ecliptek.com | Specification Subject to Change Without Notice | Rev C 3/11/2011 | Page 1 of 7
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