參數(shù)資料
型號： EP1K100FC484-3
廠商： Altera
文件頁數(shù)： 37/86頁
文件大小： 0K
描述： IC ACEX 1K FPGA 100K 484-FBGA
產(chǎn)品培訓(xùn)模塊： Three Reasons to Use FPGA's in Industrial Designs
標(biāo)準(zhǔn)包裝： 60
系列： ACEX-1K®
LAB/CLB數(shù)： 624
邏輯元件/單元數(shù)： 4992
RAM 位總計： 49152
輸入/輸出數(shù)： 333
門數(shù)： 257000
電源電壓： 2.375 V ~ 2.625 V
安裝類型： 表面貼裝
工作溫度： 0°C ~ 70°C
封裝/外殼： 484-BGA
供應(yīng)商設(shè)備封裝： 484-FBGA（23x23）
其它名稱： 544-1062
42
Altera Corporation
ACEX 1K Programmable Logic Device Family Data Sheet
IEEE Std.
1149.1 (JTAG)
Boundary-Scan
Support
All ACEX 1K devices provide JTAG BST circuitry that complies with the
IEEE Std. 1149.1-1990 specification. ACEX 1K devices can also be
configured using the JTAG pins through the ByteBlasterMV or BitBlaster
download cable, or via hardware that uses the JamTM Standard Test and
Programming Language (STAPL), JEDEC standard JESD-71. JTAG
boundary-scan testing can be performed before or after configuration, but
not during configuration. ACEX 1K devices support the JTAG
instructions shown in Table 14.
The instruction register length of ACEX 1K devices is 10 bits. The
USERCODE register length in ACEX 1K devices is 32 bits; 7 bits are
determined by the user, and 25 bits are pre-determined. Tables 15 and 16
show the boundary-scan register length and device IDCODE information
for ACEX 1K devices.
Table 14. ACEX 1K JTAG Instructions
JTAG Instruction
Description
SAMPLE/PRELOAD
Allows a snapshot of signals at the device pins to be captured and examined during
normal device operation and permits an initial data pattern to be output at the device
pins.
EXTEST
Allows the external circuitry and board-level interconnections to be tested by forcing a
test pattern at the output pins and capturing test results at the input pins.
BYPASS
Places the 1-bit bypass register between the TDI and TDO pins, allowing the BST data
to pass synchronously through a selected device to adjacent devices during normal
operation.
USERCODE
Selects the user electronic signature (USERCODE) register and places it between the
TDI
and TDO pins, allowing the USERCODE to be serially shifted out of TDO.
IDCODE
Selects the IDCODE register and places it between TDI and TDO, allowing the IDCODE
to be serially shifted out of TDO.
ICR Instructions
These instructions are used when configuring an ACEX 1K device via JTAG ports using
a MasterBlaster, ByteBlasterMV, or BitBlaster download cable, or a Jam File (.jam) or
Jam Byte-Code File (.jbc) via an embedded processor.
Table 15. ACEX 1K Boundary-Scan Register Length
Device
Boundary-Scan Register Length
EP1K10
438
EP1K30
690
EP1K50
798
EP1K100
1,050
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
EP1K100FC484-3N 功能描述:FPGA - 現(xiàn)場可編程門陣列 FPGA - ACEX 1K 624 LABs 333 IOs RoHS:否 制造商:Altera Corporation 系列:Cyclone V E 柵極數(shù)量: 邏輯塊數(shù)量:943 內(nèi)嵌式塊RAM - EBR:1956 kbit 輸入/輸出端數(shù)量:128 最大工作頻率:800 MHz 工作電源電壓:1.1 V 最大工作溫度:+ 70 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:FBGA-256
EP1K100FI2562 制造商:Altera Corporation 功能描述:
EP1K100FI256-2 功能描述:FPGA - 現(xiàn)場可編程門陣列 FPGA - ACEX 1K 624 LABs 186 IOs RoHS:否 制造商:Altera Corporation 系列:Cyclone V E 柵極數(shù)量: 邏輯塊數(shù)量:943 內(nèi)嵌式塊RAM - EBR:1956 kbit 輸入/輸出端數(shù)量:128 最大工作頻率:800 MHz 工作電源電壓:1.1 V 最大工作溫度:+ 70 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:FBGA-256
EP1K100FI256-2N 功能描述:FPGA - 現(xiàn)場可編程門陣列 FPGA - ACEX 1K 624 LABs 186 IOs RoHS:否 制造商:Altera Corporation 系列:Cyclone V E 柵極數(shù)量: 邏輯塊數(shù)量:943 內(nèi)嵌式塊RAM - EBR:1956 kbit 輸入/輸出端數(shù)量:128 最大工作頻率:800 MHz 工作電源電壓:1.1 V 最大工作溫度:+ 70 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:FBGA-256
EP1K100FI484-2 功能描述:FPGA - 現(xiàn)場可編程門陣列 FPGA - ACEX 1K 624 LABs 333 IOs RoHS:否 制造商:Altera Corporation 系列:Cyclone V E 柵極數(shù)量: 邏輯塊數(shù)量:943 內(nèi)嵌式塊RAM - EBR:1956 kbit 輸入/輸出端數(shù)量:128 最大工作頻率:800 MHz 工作電源電壓:1.1 V 最大工作溫度:+ 70 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:FBGA-256
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