參數(shù)資料
型號: EPM240T100I5
廠商: Altera
文件頁數(shù): 1/6頁
文件大小: 0K
描述: IC MAX II CPLD 240 LE 100-TQFP
產(chǎn)品變化通告: Bond Wire Change 4/Sept/2008
標準包裝: 270
系列: MAX® II
可編程類型: 系統(tǒng)內(nèi)可編程
最大延遲時間 tpd(1): 4.7ns
電壓電源 - 內(nèi)部: 2.5V,3.3V
邏輯元件/邏輯塊數(shù)目: 240
宏單元數(shù): 192
輸入/輸出數(shù): 80
工作溫度: -40°C ~ 100°C
安裝類型: 表面貼裝
封裝/外殼: 100-TQFP
供應(yīng)商設(shè)備封裝: 100-TQFP(14x14)
包裝: 托盤
產(chǎn)品目錄頁面: 603 (CN2011-ZH PDF)
其它名稱: 544-1965
EPM240T100I5-ND
Q2136226
1. Introduction
Introduction
The MAX II family of instant-on, non-volatile CPLDs is based on a 0.18-m,
6-layer-metal-flash process, with densities from 240 to 2,210 logic elements (LEs) (128
to 2,210 equivalent macrocells) and non-volatile storage of 8 Kbits. MAX II devices
offer high I/O counts, fast performance, and reliable fitting versus other CPLD
architectures. Featuring MultiVolt core, a user flash memory (UFM) block, and
enhanced in-system programmability (ISP), MAX II devices are designed to reduce
cost and power while providing programmable solutions for applications such as bus
bridging, I/O expansion, power-on reset (POR) and sequencing control, and device
configuration control.
Features
The MAX II CPLD has the following features:
Low-cost, low-power CPLD
Instant-on, non-volatile architecture
Standby current as low as 25 A
Provides fast propagation delay and clock-to-output times
Provides four global clocks with two clocks available per logic array block (LAB)
UFM block up to 8 Kbits for non-volatile storage
MultiVolt core enabling external supply voltages to the device of either
3.3 V/2.5 V or 1.8 V
MultiVolt I/O interface supporting 3.3-V, 2.5-V, 1.8-V, and 1.5-V logic levels
Bus-friendly architecture including programmable slew rate, drive strength,
bus-hold, and programmable pull-up resistors
Schmitt triggers enabling noise tolerant inputs (programmable per pin)
I/Os are fully compliant with the Peripheral Component Interconnect Special
Interest Group (PCI SIG) PCI Local Bus Specification, Revision 2.2 for 3.3-V
operation at 66 MHz
Supports hot-socketing
Built-in Joint Test Action Group (JTAG) boundary-scan test (BST) circuitry
compliant with IEEE Std. 1149.1-1990
ISP circuitry compliant with IEEE Std. 1532
MII51001-1.9
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