參數(shù)資料
型號: EPM570GT144C5N
廠商: Altera
文件頁數(shù): 1/6頁
文件大?。?/td> 0K
描述: IC MAX II CPLD 570 LE 144-TQFP
標(biāo)準(zhǔn)包裝: 180
系列: MAX® II
可編程類型: 系統(tǒng)內(nèi)可編程
最大延遲時間 tpd(1): 5.4ns
電壓電源 - 內(nèi)部: 1.71 V ~ 1.89 V
邏輯元件/邏輯塊數(shù)目: 570
宏單元數(shù): 440
輸入/輸出數(shù): 116
工作溫度: 0°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 144-LQFP
供應(yīng)商設(shè)備封裝: 144-TQFP(20x20)
包裝: 托盤
產(chǎn)品目錄頁面: 603 (CN2011-ZH PDF)
其它名稱: 544-1408
EPM570GT144C5N-ND
1. Introduction
Introduction
The MAX II family of instant-on, non-volatile CPLDs is based on a 0.18-m,
6-layer-metal-flash process, with densities from 240 to 2,210 logic elements (LEs) (128
to 2,210 equivalent macrocells) and non-volatile storage of 8 Kbits. MAX II devices
offer high I/O counts, fast performance, and reliable fitting versus other CPLD
architectures. Featuring MultiVolt core, a user flash memory (UFM) block, and
enhanced in-system programmability (ISP), MAX II devices are designed to reduce
cost and power while providing programmable solutions for applications such as bus
bridging, I/O expansion, power-on reset (POR) and sequencing control, and device
configuration control.
Features
The MAX II CPLD has the following features:
Low-cost, low-power CPLD
Instant-on, non-volatile architecture
Standby current as low as 25 A
Provides fast propagation delay and clock-to-output times
Provides four global clocks with two clocks available per logic array block (LAB)
UFM block up to 8 Kbits for non-volatile storage
MultiVolt core enabling external supply voltages to the device of either
3.3 V/2.5 V or 1.8 V
MultiVolt I/O interface supporting 3.3-V, 2.5-V, 1.8-V, and 1.5-V logic levels
Bus-friendly architecture including programmable slew rate, drive strength,
bus-hold, and programmable pull-up resistors
Schmitt triggers enabling noise tolerant inputs (programmable per pin)
I/Os are fully compliant with the Peripheral Component Interconnect Special
Interest Group (PCI SIG) PCI Local Bus Specification, Revision 2.2 for 3.3-V
operation at 66 MHz
Supports hot-socketing
Built-in Joint Test Action Group (JTAG) boundary-scan test (BST) circuitry
compliant with IEEE Std. 1149.1-1990
ISP circuitry compliant with IEEE Std. 1532
MII51001-1.9
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