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參數(shù)資料
| 型號： | EVAL-AD5541/42EBZ |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 2/20頁 |
| 文件大?。?/td> | 0K |
| 描述： | BOARD EVAL FOR AD5441/2 |
| 產(chǎn)品培訓(xùn)模塊： | DAC Architectures |
| 標(biāo)準(zhǔn)包裝： | 1 |
| DAC 的數(shù)量： | 1 |
| 位數(shù)： | 16 |
| 采樣率（每秒）： | 1.5M |
| 數(shù)據(jù)接口： | 串行 |
| 設(shè)置時間： | 1µs |
| DAC 型： | 電壓 |
| 工作溫度： | -40°C ~ 85°C |
| 已供物品： | 板，纜線，CD |
| 已用 IC / 零件： | AD5541，AD5542 |
| 相關(guān)產(chǎn)品： | AD5441BRMZ-REEL7-ND - IC DAC 12BIT SERIAL IN 8MSOP AD5441BCPZ-REEL7DKR-ND - IC DAC 12BIT SERIAL IN 8LFCSP AD5441BCPZ-REEL7CT-ND - IC DAC 12BIT SERIAL IN 8LFCSP AD5441BRMZ-ND - IC DAC 12BIT SERIAL IN 8MSOP AD5441BCPZ-REEL7TR-ND - IC DAC 12BIT SERIAL IN 8LFCSP |
AD5541/AD5542
Data Sheet
Rev. F | Page 10 of 20
TERMINOLOGY
Relative Accuracy or Integral Nonlinearity (INL)
For the DAC, relative accuracy or INL is a measure of the
maximum deviation, in LSBs, from a straight line passing
through the endpoints of the DAC transfer function. A typical
INL vs. code plot can be seen in Figure 6.
Differential Nonlinearity (DNL)
DNL is the difference between the measured change and the
ideal 1 LSB change between any two adjacent codes. A specified
differential nonlinearity of ±1 LSB maximum ensures mono-
tonicity. Figure 9 illustrates a typical DNL vs. code plot.
Gain Error
Gain error is the difference between the actual and ideal analog
output range, expressed as a percent of the full-scale range.
It is the deviation in slope of the DAC transfer characteristic
from ideal.
Gain Error Temperature Coefficient
Gain error temperature coefficient is a measure of the change
in gain error with changes in temperature. It is expressed in
ppm/°C.
Zero Code Error
Zero code error is a measure of the output error when zero code
is loaded to the DAC register.
Zero Code Temperature Coefficient
This is a measure of the change in zero code error with a change
in temperature. It is expressed in mV/°C.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-sec
and is measured when the digital input code is changed by
1 LSB at the major carry transition. A plot of the digital-to-
analog glitch impulse is shown in Figure 19.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital inputs of the
DAC, but it is measured when the DAC output is not updated.
CS is held high while the CLK and DIN signals are toggled. It
is specified in nV-sec and is measured with a full-scale code
change on the data bus, that is, from all 0s to all 1s and vice
versa. A typical plot of digital feedthrough is shown in
Power Supply Rejection Ratio (PSRR)
PSRR indicates how the output of the DAC is affected by changes
in the power supply voltage. Power-supply rejection ratio is
quoted in terms of percent change in output per percent change
in VDD for full-scale output of the DAC. VDD is varied by ±10%.
Reference Feedthrough
Reference feedthrough is a measure of the feedthrough from the
VREF input to the DAC output when the DAC is loaded with all
0s. A 100 kHz, 1 V p-p is applied to VREF. Reference feedthrough
is expressed in mV p-p.
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| EVAL-AD5541ASDZ | 功能描述:BOARD EVAL FOR AD5541 RoHS:是 類別:編程器，開發(fā)系統(tǒng) >> 評估板 - 數(shù)模轉(zhuǎn)換器 (DAC) 系列:nanoDAC™ 產(chǎn)品培訓(xùn)模塊:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 標(biāo)準(zhǔn)包裝:1 系列:- DAC 的數(shù)量:4 位數(shù):12 采樣率（每秒）:- 數(shù)據(jù)接口:串行，SPI? 設(shè)置時間:3µs DAC 型:電流/電壓 工作溫度:-40°C ~ 85°C 已供物品:板 已用 IC / 零件:MAX5581 |
| EVAL-AD5542ASDZ | 功能描述:BOARD EVAL FOR AD5542 RoHS:是 類別:編程器，開發(fā)系統(tǒng) >> 評估板 - 數(shù)模轉(zhuǎn)換器 (DAC) 系列:nanoDAC™ 產(chǎn)品培訓(xùn)模塊:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 標(biāo)準(zhǔn)包裝:1 系列:- DAC 的數(shù)量:4 位數(shù):12 采樣率（每秒）:- 數(shù)據(jù)接口:串行，SPI? 設(shè)置時間:3µs DAC 型:電流/電壓 工作溫度:-40°C ~ 85°C 已供物品:板 已用 IC / 零件:MAX5581 |
| EVAL-AD5543SDZ | 功能描述:BOARD EVAL FOR AD5543 RoHS:是 類別:編程器，開發(fā)系統(tǒng) >> 評估板 - 數(shù)模轉(zhuǎn)換器 (DAC) 系列:- 產(chǎn)品培訓(xùn)模塊:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 標(biāo)準(zhǔn)包裝:1 系列:- DAC 的數(shù)量:4 位數(shù):12 采樣率（每秒）:- 數(shù)據(jù)接口:串行，SPI? 設(shè)置時間:3µs DAC 型:電流/電壓 工作溫度:-40°C ~ 85°C 已供物品:板 已用 IC / 零件:MAX5581 |
| EVAL-AD5544SDZ | 功能描述:BOARD EVAL FOR AD5544 RoHS:是 類別:編程器，開發(fā)系統(tǒng) >> 評估板 - 數(shù)模轉(zhuǎn)換器 (DAC) 系列:- 產(chǎn)品培訓(xùn)模塊:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 標(biāo)準(zhǔn)包裝:1 系列:- DAC 的數(shù)量:4 位數(shù):12 采樣率（每秒）:- 數(shù)據(jù)接口:串行，SPI? 設(shè)置時間:3µs DAC 型:電流/電壓 工作溫度:-40°C ~ 85°C 已供物品:板 已用 IC / 零件:MAX5581 |
| EVAL-AD5545SDZ | 功能描述:BOARD EVAL FOR AD5545 RoHS:是 類別:編程器，開發(fā)系統(tǒng) >> 評估板 - 數(shù)模轉(zhuǎn)換器 (DAC) 系列:* 產(chǎn)品培訓(xùn)模塊:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 標(biāo)準(zhǔn)包裝:1 系列:- DAC 的數(shù)量:4 位數(shù):12 采樣率（每秒）:- 數(shù)據(jù)接口:串行，SPI? 設(shè)置時間:3µs DAC 型:電流/電壓 工作溫度:-40°C ~ 85°C 已供物品:板 已用 IC / 零件:MAX5581 |
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