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| 型號： | EVAL-AD5629REBRZ |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 11/32頁 |
| 文件大?。?/td> | 0K |
| 描述： | BOARD EVAL FOR AD5629 TSSOP |
| 標準包裝： | 1 |
| 系列： | denseDAC |
| DAC 的數(shù)量： | 8 |
| 位數(shù)： | 12 |
| 數(shù)據(jù)接口： | I²C，串行 |
| 設(shè)置時間： | 2.5µs |
| DAC 型： | 電壓 |
| 工作溫度： | -40°C ~ 105°C |
| 已供物品： | 板 |
| 已用 IC / 零件： | AD5629 |
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Data Sheet
AD5629R/AD5669R
Rev. D | Page 19 of 32
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy, or integral nonlinearity (INL), is
a measure of the maximum deviation in LSBs from a straight line
passing through the endpoints of the DAC transfer function.
show plots of typical INL vs. code.
Differential Nonlinearity
Differential nonlinearity (DNL) is the difference between the
measured change and the ideal 1 LSB change between any two
adjacent codes. A specified differential nonlinearity of ±1 LSB
maximum ensures monotonicity. This DAC is guaranteed
monotonic by design. Figure 8, Figure 9, Figure 12, Figure 13,
Figure 16, and Figure 17 show plots of typical DNL vs. code.
Offset Error
Offset error is a measure of the difference between the actual
VOUT and the ideal VOUT, expressed in millivolts in the linear
region of the transfer function. Offset error is measured on the
AD5669R between Code 512 and Code 65024 loaded into the
DAC register. It can be negative or positive and is expressed in
millivolts.
Zero-Code Error
Zero-code error is a measure of the output error when zero
code (0x0000) is loaded into the DAC register. Ideally, the
output should be 0 V. The zero-code error is always positive
because the output of the DAC cannot go below 0 V. It is due to
a combination of the offset errors in the DAC and output
amplifier. Zero-code error is expressed in millivolts. Figure 19
shows a plot of typical zero-code error vs. temperature.
Gain Error
Gain error is a measure of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from the
ideal, expressed as a percentage of the full-scale range.
Zero-Code Error Drift
Zero-code error drift is a measure of the change in zero-code
error with a change in temperature. It is expressed in μV/°C.
Gain Error Drift
Gain error drift is a measure of the change in gain error with
changes in temperature. It is expressed in (ppm of full-scale
range)/°C.
Full-Scale Error
Full-scale error is a measure of the output error when full-scale
code (0xFFFF) is loaded into the DAC register. Ideally, the
output should be VREF 1 LSB. Full-scale error is expressed as
a percentage of the full-scale range. Figure 18 shows a plot of
typical full-scale error vs. temperature.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-s and
is measured when the digital input code is changed by 1 LSB at
the major carry transition (0x7FFF to 0x8000). Figure 35 shows
a typical digital-to-analog glitch impulse plot.
DC Power Supply Rejection Ratio (PSRR)
PSRR indicates how the output of the DAC is affected by changes
in the supply voltage. PSRR is the ratio of the change in VOUT to
a change in VDD for full-scale output of the DAC. VREF is held at
2 V, and VDD is varied ±10%. It is measured in decibels.
DC Crosstalk
DC crosstalk is the dc change in the output level of one DAC in
response to a change in the output of another DAC. It is measured
with a full-scale output change on one DAC (or soft power-down
and power-up) while monitoring another DAC kept at midscale.
It is expressed in microvolts.
DC crosstalk due to load current change is a measure of the
impact that a change in load current on one DAC has on another
DAC kept at midscale. It is expressed in microvolts per milliamp.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of a DAC from the digital input pins of the
device, but is measured when the DAC is not being written to. It
is specified in nV-s and measured with a full-scale change on
the digital input pins, that is, from all 0s to all 1s or vice versa.
Digital Crosstalk
Digital crosstalk is the glitch impulse transferred to the output
of one DAC at midscale in response to a full-scale code change
(all 0s to all 1s or vice versa) in the input register of another DAC.
It is measured in standalone mode and is expressed in nV-s.
Analog Crosstalk
Analog crosstalk is the glitch impulse transferred to the output
of one DAC due to a change in the output of another DAC. It is
measured by loading one of the input registers with a full-scale
code change (all 0s to all 1s or vice versa) while keeping
A
LDACE
A
high and then pulsing
A
LDACE
A
low and monitoring the output of
the DAC whose digital code has not changed. The area of the
glitch is expressed in nV-s.
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參數(shù)描述 |
|---|---|
| EVAL-AD5629RSDZ | 功能描述:BOARD EVAL FOR AD5629 RoHS:是 類別:編程器，開發(fā)系統(tǒng) >> 評估板 - 數(shù)模轉(zhuǎn)換器 (DAC) 系列:denseDAC 產(chǎn)品培訓(xùn)模塊:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 標準包裝:1 系列:- DAC 的數(shù)量:4 位數(shù):12 采樣率（每秒）:- 數(shù)據(jù)接口:串行，SPI? 設(shè)置時間:3µs DAC 型:電流/電壓 工作溫度:-40°C ~ 85°C 已供物品:板 已用 IC / 零件:MAX5581 |
| EVAL-AD5660DKZ | 功能描述:BOARD DEMO FOR AD5660 RoHS:是 類別:編程器，開發(fā)系統(tǒng) >> 評估板 - 數(shù)模轉(zhuǎn)換器 (DAC) 系列:nanoDAC™ 產(chǎn)品培訓(xùn)模塊:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 標準包裝:1 系列:- DAC 的數(shù)量:4 位數(shù):12 采樣率（每秒）:- 數(shù)據(jù)接口:串行，SPI? 設(shè)置時間:3µs DAC 型:電流/電壓 工作溫度:-40°C ~ 85°C 已供物品:板 已用 IC / 零件:MAX5581 |
| EVAL-AD5660EB | 制造商:Analog Devices 功能描述:EVAL BD FOR AD5660 - Bulk |
| EVAL-AD5660EBZ | 功能描述:BOARD EVALUATION FOR AD5660 RoHS:是 類別:編程器，開發(fā)系統(tǒng) >> 評估板 - 數(shù)模轉(zhuǎn)換器 (DAC) 系列:nanoDAC™ 產(chǎn)品培訓(xùn)模塊:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 標準包裝:1 系列:- DAC 的數(shù)量:4 位數(shù):12 采樣率（每秒）:- 數(shù)據(jù)接口:串行，SPI? 設(shè)置時間:3µs DAC 型:電流/電壓 工作溫度:-40°C ~ 85°C 已供物品:板 已用 IC / 零件:MAX5581 |
| EVAL-AD5662EB | 制造商:Analog Devices 功能描述:EVAL BOARD - Bulk |
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