參數(shù)資料
型號: FK2660-7RT
元件分類: 電源模塊
英文描述: 2-OUTPUT 150 W DC-DC REG PWR SUPPLY MODULE
封裝: HEAT SINK, METAL, CASE K02, MODULE
文件頁數(shù): 29/31頁
文件大?。?/td> 637K
代理商: FK2660-7RT
Cassette Style
150 Watt DC-DC Converters
K Series
Edition 01/01.2000
7/31
Electrical Output Data
General Conditions
TA = 25
°C, unless T
C is specified.
– Pin 18 (i) connected to pin 14 (S–/Vo1–),
Uo adjusted to Uo nom (option P), R input not connected.
– Sense line pins 12 (S+) and 14 (S–) connected to Vo1+ and Vo1– respectively.
Table 4a: Output data single output modules AK/BK
Output
AK/BK 1001
AK/BK 1301
AK/BK 1501
AK/BK 1601
5.1 V
12.0 V
15.0 V
24.0 V
Characteristics
Conditions
min
typ max
min
typ max
min
typ max
min
typ max
Unit
Uo
Output voltage
Ui nom, Io nom
5.07
5.13
11.93
12.07
14.91
15.09
23.86
24.14
V
Uo P
Overvoltage protection
7.6
21
26.5
43.5
(suppressor diode)
Io nom Output current 1
Ui min…Ui max
20.0/25.0
10.0/12.0
8.0/10.0
5.0/6.0
A
TC min…TC max
Io L
Output current limit 4
Ui min…Ui max
21/26
10.2/12.2
8.2/10.2
5.2/6.2
uo7
Output
Switching freq.
Ui nom, Io nom
10
555
mVpp
voltage
Total
IEC/EN 61204
60
40
30
50
noise
BW = 20 MHz
DUo u Static line regulation
Ui min...Ui nom
±15
±25
±30
mV
Ui nom...Ui max
Io nom
DUo I
Static load regulation
Ui nom, Io =
20
253040
(0.1…1)
Io nom
uo d 5
Dynamic
Voltage
Ui nom, Io =
±220
±110
±150
±130
load
deviation
Io nom 1/2 Io nom
td 5
regulation
Recovery
IEC/EN 61204
0.6
0.5
1
ms
time
aUo
Temperature coefficient
TC min…TC max
–0.2
–1
–1mV/K
of output voltage 6
0...
I o nom
1 If the output voltages are increased above Uo nom through R-input control, option P setting, remote sensing or option T, the output cur-
rent should be reduced accordingly so that
Po nom is not exceeded.
4 See: Output voltage regulation of single output units.
5 See: Dynamic load regulation of Uo1.
6 Negative temperature coefficient (0...–3 mV/cell and K) available on request
7 Measured according to IEC/EN 61204 sub clause 3.10 with a probe acc. to annex A of the same standards. (see: Technical Informa-
tion: Measuring and Testing)
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