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參數(shù)資料
| 型號： | FSA2267MUX |
| 廠商： | FAIRCHILD SEMICONDUCTOR CORP |
| 元件分類： | 運動控制電子 |
| 英文描述： | 0.35ヘ Low-Voltage Dual-SPDT Analog Switch |
| 中文描述： | DUAL 1-CHANNEL, SGL POLE DOUBLE THROW SWITCH, PDSO10 |
| 封裝： | 3 MM, LEAD FREE, MO-187BA, MSOP-10 |
| 文件頁數(shù)： | 4/16頁 |
| 文件大?。?/td> | 1540K |
| 代理商： | FSA2267MUX |
Ω
2005 Fairchild Semiconductor Corporation
FSA2267 / FSA2267A Rev. 1.0.3
www.fairchildsemi.com
4
ESD Protection
ESD Performance of the FSA2267/FSA2267A
FSA2267
■
HBM all pins 7.0kV
■
CDM all pins 1.0kV
FSA267A
■
HBM all pins 7.5kV
■
CDM all pins 1.0kV
Human Body Model
Figure 5 shows the schematic representation of the
Human Body Model ESD event. Figure 6 is the ideal
waveform representation of the Human Body Model. The
device is tested to JEDEC: JESD22-A114 Human Body
Model.
Charged Device Model
In manufacturing test and handling environments, a
more useful model is the Charged Device Model and the
FSA2267/FSA2267A has a very good ESD immunity to
this model. The device is tested to JEDEC: JESD22-
C101 Charged Device Model.
IEC 61000-4-2
The IEC 61000-4-2 standard covers ESD testing and
performance of finished equipment and evaluates the
equipment in its entirety for ESD immunity. Fairchild
Semiconductor has evaluated this device using the
IEC 6100-4-2 representative system model depicted in
Figure 7.
ESD values measured via the IEC 61000-4-2 evaluation
method are influenced by the specific board layout,
board size, and many other factors of the manufacturer’s
product application. Measured system ESD values can-
not be guaranteed by Fairchild Semiconductor to exactly
correlate to a manufacturer’s in-house testing due to
these application environment variables. Fairchild Semi-
conductor has been able to determine that, for ultra-por-
table applications, an enhanced ESD immunity, relative
to the IEC 61000-4-2 specification, can be achieved with
the inclusion of a 100
Ω
series resistor in the V
CC
supply
path to the analog switch (see Figure 8). Typical
improvements of between 3-6kV of ESD immunity (I/O to
GND) have been measured with the inclusion of the
resistor with the IEC 61000-4-2 representative model.
For more information on ESD testing methodologies,
please refer to:
AN-6019 Fairchild Analog Switch Products ESD Test
Methodology Overview
http://www.fairchildsemi.com/an/AN/AN-6019.pdf.
Additional ESD Test Conditions
For information regarding test methodologies and perfor-
mance levels, please contact Fairchild Semiconductor.
Figure 5. Human Body ESD Test Model
Figure 6. HBM Current Waveform
Figure 7. IEC 61000-4-2 ESD Test Model
Figure 8. ESD Immunity with 100
Ω
Resistor
1B
0
1B
1
2B
0
2B
1
1A
1S
2A
2S
ESD Event
100
Analog Switch Supply Rail
Ultra-portable Connector
V
CC
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