參數(shù)資料
型號(hào): GS88136CD-333IT
廠商: GSI TECHNOLOGY
元件分類: SRAM
英文描述: 256K X 36 CACHE SRAM, PBGA165
封裝: 13 X 15 MM, 1 MM PITCH, FPBGA-165
文件頁(yè)數(shù): 9/37頁(yè)
文件大小: 1286K
代理商: GS88136CD-333IT
AC Test Conditions
Parameter
Conditions
Input high level
VDD – 0.2 V
Input low level
0.2 V
Input slew rate
1 V/ns
Input reference level
VDD/2
Output reference level
VDDQ/2
Output load
Fig. 1
Notes:
1. Include scope and jig capacitance.
2. Test conditions as specified with output loading as shown in Fig. 1 unless otherwise noted.
3. Device is deselected as defined by the Truth Table.
GS88118C(T/D)/GS88132C(T/D)/GS88136C(T/D)
Rev: 1.01 6/2010
17/37
2008, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
DQ
VDDQ/2
50
Ω
30pF*
Output Load 1
* Distributed Test Jig Capacitance
DC Electrical Characteristics
Parameter
Symbol
Test Conditions
Min
Max
Input Leakage Current
(except mode pins)
IIL
VIN = 0 to VDD
–1 uA
1 uA
ZZ Input Current
IIN1
VDD ≥ VIN ≥ VIH
0 V
≤ VIN ≤ VIH
–1 uA
1 uA
100 uA
Output Leakage Current
IOL
Output Disable, VOUT = 0 to VDD
–1 uA
1 uA
Output High Voltage
VOH2
IOH = –8 mA, VDDQ = 2.375 V
1.7 V
Output High Voltage
VOH3
IOH = –8 mA, VDDQ = 3.135 V
2.4 V
Output Low Voltage
VOL
IOL = 8 mA
0.4 V
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