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參數(shù)資料
| 型號： | GS881E36BT-300I |
| 廠商： | GSI TECHNOLOGY |
| 元件分類： | SRAM |
| 英文描述： | 512K x 18, 256K x 32, 256K x 36 9Mb Sync Burst SRAMs |
| 中文描述： | 256K X 36 CACHE SRAM, 5 ns, PQFP100 |
| 封裝： | TQFP-100 |
| 文件頁數(shù)： | 24/39頁 |
| 文件大?。?/td> | 815K |
| 代理商： | GS881E36BT-300I |
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GS881E18B(T/D)/GS881E32B(T/D)/GS881E36B(T/D)
Rev: 1.04a 3/2009
30/39
2002, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
JTAG TAP Instruction Set Summary
Instruction
Code
Description
Notes
EXTEST
000
Places the Boundary Scan Register between TDI and TDO.
1
IDCODE
001
Preloads ID Register and places it between TDI and TDO.
1, 2
SAMPLE-Z
010
Captures I/O ring contents. Places the Boundary Scan Register between TDI and
TDO.
Forces all RAM output drivers to High-Z.
1
RFU
011
Do not use this instruction; Reserved for Future Use.
Replicates BYPASS instruction. Places Bypass Register between TDI and TDO.
1
SAMPLE/
PRELOAD
100
Captures I/O ring contents. Places the Boundary Scan Register between TDI and
TDO.
1
GSI
101
GSI private instruction.
1
RFU
110
Do not use this instruction; Reserved for Future Use.
Replicates BYPASS instruction. Places Bypass Register between TDI and TDO.
1
BYPASS
111
Places Bypass Register between TDI and TDO.
1
Notes:
1. Instruction codes expressed in binary, MSB on left, LSB on right.
2. Default instruction automatically loaded at power-up and in test-logic-reset state.
Notes:
1. Include scope and jig capacitance.
2. Test conditions as shown unless otherwise noted.
JTAG Port AC Test Conditions
Parameter
Conditions
Input high level
VDD – 0.2 V
Input low level
0.2 V
Input slew rate
1 V/ns
Input reference level
VDDQ/2
Output reference level
VDDQ/2
DQ
VDDQ/2
50
30pF*
JTAG Port AC Test Load
* Distributed Test Jig Capacitance
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|---|---|
| GS881E36BT-333 | 512K x 18, 256K x 32, 256K x 36 9Mb Sync Burst SRAMs |
| GS881E36BGT-250T | 256K X 36 CACHE SRAM, 5.5 ns, PQFP100 |
| GS882Z36BD-166 | 256K X 36 ZBT SRAM, 7 ns, PBGA165 |
| GS882Z36BGD-166I | 256K X 36 ZBT SRAM, 7 ns, PBGA165 |
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| GS881E36BT-333 | 制造商:GSI 制造商全稱:GSI Technology 功能描述:512K x 18, 256K x 32, 256K x 36 9Mb Sync Burst SRAMs |
| GS881E36BT-333I | 制造商:GSI 制造商全稱:GSI Technology 功能描述:512K x 18, 256K x 32, 256K x 36 9Mb Sync Burst SRAMs |
| GS881E36CD-300 | 制造商:GSI Technology 功能描述:SRAM SYNC QUAD 2.5V/3.3V 9MBIT 256KX36 5NS/2.5NS 165FPBGA - Trays |
| GS881E36CD-300I | 制造商:GSI Technology 功能描述:SRAM SYNC QUAD 2.5V/3.3V 9MBIT 256KX36 5NS/2.5NS 165FPBGA - Trays |
| GS881E36CD-333 | 制造商:GSI Technology 功能描述:SRAM SYNC QUAD 2.5V/3.3V 9MBIT 256KX36 4.5NS/2.5NS 165FPBGA - Trays |
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