AC TEST CONDITIONS
Input pulse levels
0V to 3.0V
Input rise and fall times
1.5ns
Input timing reference levels
1.5V
Output reference levels
1.5V
Output load
See Figures 1 and 2
OUTPUT LOADS
Vt = 1.5V
30 pF
DQ
Z
0
= 50
Fig. 1 OUTPUT LOAD EQUIVALENT
50
DQ
3.3v
317
351
Fig. 2 OUTPUT LOAD EQUIVALENT
5 pF
January 22, 199 9
Rev. 1/99
6
Galvantech, Inc. reserves the right to change products or specifications without notice
GVT73128A16
REVOLUTIONARY PINOUT 128K X 16
GALVANTECH
, NC.
NOTES
1.
All voltages referenced to VSS (GND).
V
IH
≤
+6.0V for t
≤
t
RC /2.
Undershoot:
V
IL
≤
-2.0V for t
≤
t
RC /2
I
cc
is given with no output current. I
cc
increases with greater
output loading and faster cycle times.
2.
Overshoot:
3.
4.
This parameter is sampled.
5.
Test conditions as specified with the output loading as shown in
Fig. 1 unless otherwise noted.
6.
Output loading is specified with C
L
=5pF as in Fig. 2. Transition
is measured +500mV from steady state voltage.
At any given temperature and voltage condition,
t
HZCE is less
than
t
LZCE and
t
HZWE is less than
t
LZWE.
7.
8.
WE# is HIGH for READ cycle.
9.
are held in their active state.
10. Address valid prior to, or coincident with, latest occurring chip
enable.
11.
t
RC
= Read Cycle Time.
12. Chip Enable and Write Enable can initiate and terminate a
WRITE cycle.
13. Capacitance derating applies to capacitance different from the
load capacitance shown in Fig. 1.
14. Typical values are measured at 3.3V, 25
o
C and 20ns cycle time.
DATA RETENTION ELECTRICAL CHARACTERISTICS (L Version Only )
DESCRIPTIO N
CONDITION S
SYMBOL
MIN
TYP
MAX
UNITS
NOTES
Vcc for Retention Data
Data Retention Current
V
DR
I
CCDR
I
CCDR
2
V
CE# >VCC -0.2;
all other inputs < VSS +0.2
or >VCC -0.2;
all inputs static; f= 0
Vcc = 2V
Vcc = 3V
2
3
0.8
1.2
mA
mA
13
13
Chip Deselect to
Data Retention Time
Operation Recovery Time
t
CDR
0
ns
4
t
R
t
RC
ns
4, 11