參數(shù)資料
型號(hào): HA4P2425-5
廠商: HARRIS SEMICONDUCTOR
元件分類: 運(yùn)動(dòng)控制電子
英文描述: 3.2レs Sample and Hold Amplifiers
中文描述: SAMPLE AND HOLD AMPLIFIER, 3.2 us ACQUISITION TIME, PQCC20
文件頁(yè)數(shù): 6/9頁(yè)
文件大?。?/td> 128K
代理商: HA4P2425-5
5-6
Glossary of Terms
Acquisition Time
The time required following a “sample” command, for the output
to reach its final value within
±
0.1% or
±
0.01%. This is the mini-
mum sample time required to obtain a given accuracy, and
includes switch delay time, slewing time and settling time.
Aperture Time
The time required for the sample-and-hold switch to open,
independent of delays through the switch driver and input
amplifier circuitry. The switch opening time is that interval
between the conditions of 10% open and 90% open.
Effective Aperture Delay Time (EADT)
The difference between the digital delay time from the Hold
command to the opening of the S/H switch, and the propaga-
tion time from the analog input to the switch.
EADT may be positive, negative or zero. If zero, the S/H ampli-
fier will output a voltage equal to V
IN
at the instant the Hold
command was received. For negative EADT, the output in Hold
(exclusive of pedestal and droop errors) will correspond to a
value of V
IN
that occurred before the Hold command.
Aperture Uncertainty
The range of variation in Effective Aperture Delay Time. Aper-
ture Uncertainty (also called Aperture Delay Uncertainty,
Aperture Time Jitter, etc.) sets a limit on the accuracy with
which a waveform can be reconstructed from sample data.
Drift Current
The net leakage current from the hold capacitor during the
hold mode. Drift current can be calculated from the droop
rate using the formula:
I
D
(pA)
C
H
(pF)
V
t
-------
×
(V s
)
=
Typical Performance Curves
FIGURE 10. TYPICAL SAMPLE AND HOLD PERFORMANCE AS
A FUNCTION OF HOLDING CAPACITOR
FIGURE 11. BROADBAND NOISE CHARACTERISTICS
FIGURE 12. DRIFT CURRENT vs TEMPERATURE
FIGURE 13. OPEN LOOP FREQUENCY RESPONSE
C
H
VALUE
10pF
100pF
1000pF
0.01
μ
F
0.1
μ
F
1.0
μ
F
1000
100
10
1.0
0.1
0.01
DRIFT DURING HOLD
AT 25
o
C (mV/s)
SLEW RATE
(V/
μ
s)
HOLD STEP
OFFSET
ERROR (mV)
UNITY GAIN
BANDWIDTH
(MHz)
UNITY GAIN PHASE
MARGIN (DEGREES)
MIN. SAMPLE TIME
FOR 0.1% ACCURACY
10V SWINGS (
μ
s)
1000
100
10
1
N
μ
V
R
)
10
100
1K
10K
100K
1M
BANDWIDTH (LOWER 3dB FREQUENCY = 10Hz)
OUTPUT NOISE
“HOLD” MODE
EQUIV. INPUT NOISE
“SAMPLE” MODE - 0
SOURCE RESISTANCE
EQUIV. INPUT NOISE
“SAMPLE” MODE - 100k
SOURCE RESISTANCE
1000
100
10
1
I
D
-50
-25
0
25
50
75
100
125
TEMPERATURE (
o
C)
100
90
80
70
60
50
40
30
20
10
0
-10
-20
-30
10
100
1K
10K
100K
1M
10M
100M
FREQUENCY (Hz)
O
C
H
= 100pF
C
H
= 1000pF
C
H
= 0.01
μ
F
C
H
= 1.0
μ
F
C
H
= 0.1
μ
F
HA-2420, HA-2425
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