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參數(shù)資料
| 型號： | HCS132KMSR |
| 廠商： | INTERSIL CORP |
| 元件分類： | 通用總線功能 |
| 英文描述： | Radiation Hardened Quad 2-Input NAND Schmitt Trigger |
| 中文描述： | HC/UH SERIES, QUAD 2-INPUT NAND GATE, CDFP14 |
| 封裝： | CERAMIC, DFP-14 |
| 文件頁數(shù)： | 4/8頁 |
| 文件大?。?/td> | 156K |
| 代理商： | HCS132KMSR |
136
Specifications HCS132MS
Output Voltage Low
VOL
VCC = 4.5V and 5.5V, VIH = 0.70(VCC),
VIL = 0.30(VCC), IOL = 50
μ
A
+25
o
C
-
0.1
V
Output Voltage High
VOH
VCC = 4.5V and 5.5V, VIH = 0.70(VCC),
VIL = 0.30(VCC), IOH = -50
μ
A
+25
o
C
VCC
-0.1
-
V
Input Leakage Current
IIN
VCC = 5.5V, VIN = VCC or GND
+25
o
C
-
±
5
μ
A
Noise Immunity
Functional Test
FN
VCC = 4.5V, VIH = 0.70(VCC),
VIL = 0.30(VCC), (Note 3)
+25
o
C
-
-
-
Input to Output
TPLH
VCC = 4.5V
+25
o
C
2
22
ns
TPHL
VCC = 4.5V
+25
o
C
2
20
ns
Input Switch Points
Vt+
VCC = 4.5
+25
o
C
1.70
3.15
V
Vt-
VCC = 4.5
+25
o
C
0.90
2.10
V
VH
VCC = 4.5
+25
o
C
0.10
1.40
V
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500
, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = VCC.
3. For functional tests, VO
≥
4.0V is recognized as a logic “1”, and VO
≤
0.5V is recognized as a logic “0”.
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25
o
C)
PARAMETER
GROUP B
SUBGROUP
DELTA LIMIT
ICC
5
3
μ
A
IOL/IOH
5
-15% of 0 Hour
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test
I
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test
II
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Interim Test
III
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTE: 1. Alternate Group A testing in accordance with Method 5005 of MIL-STD-883 may be exercised.
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
PARAMETER
SYMBOL
(NOTES 1, 2)
CONDITIONS
TEMPERATURE
200K RAD
LIMITS
UNITS
MIN
MAX
Spec Number
518750
相關PDF資料 |
PDF描述 |
|---|---|
| HCS132K | Radiation Hardened Quad 2-Input NAND Schmitt Trigger |
| HCS132MS | Radiation Hardened Quad 2-Input NAND Schmitt Trigger |
| HCS132D | Radiation Hardened Quad 2-Input NAND Schmitt Trigger |
| HCS132DMSR | RESISTOR NETWORK; THR; BUSSED; 4.7K OHM X 15 |
| HCS132HMSR | Radiation Hardened Quad 2-Input NAND Schmitt Trigger |
相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| HCS132KMSR03 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:Logic IC |
| HCS132MS | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Quad 2-Input NAND Schmitt Trigger |
| HCS138D | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Inverting 3-to-8 Line Decoder/Demultiplexer |
| HCS138DMSR | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Inverting 3-to-8 Line Decoder/Demultiplexer |
| HCS138DTR | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Inverting 3-to-8 Line Decoder/Demultiplexer |
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