- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄371782 > HCS244MS (Intersil Corporation) Octal Buffer/Line Driver, Three-State(抗輻射 CMOS 的八透明緩沖器/線驅(qū)動(dòng)器（三態(tài)）) PDF資料下載
參數(shù)資料
| 型號(hào)： | HCS244MS |
| 廠商： | Intersil Corporation |
| 英文描述： | Octal Buffer/Line Driver, Three-State(抗輻射 CMOS 的八透明緩沖器/線驅(qū)動(dòng)器（三態(tài)）) |
| 中文描述： | 八路緩沖器/線路驅(qū)動(dòng)器，三態(tài)（抗輻射的CMOS的八透明緩沖器/線驅(qū)動(dòng)器（三態(tài)）） |
| 文件頁(yè)數(shù)： | 6/10頁(yè) |
| 文件大?。?/td> | 173K |
| 代理商： | HCS244MS |
317
Specifications HCS244MS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
Interim Test
I
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
Interim Test
II
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
PDA
100%/5004
1, 7, 9, Deltas
Interim Test
III
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTE:
1. Alternate group A testing in accordance with Method 5005 of Mil-Std-883 may be exercised.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
TEST
READ AND RECORD
PRE RAD
POST RAD
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4 (Note 1)
NOTE:
1. Except FN test which will be performed 100% go/no-go.
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OPEN
GROUND
1/2 VCC = 3V
±
0.5V
VCC = 6V
±
0.5V
OSCILLATOR
50kHz
25kHz
STATIC I BURN-IN (Note 1)
3, 5, 7, 9, 12, 14, 16, 18
1, 2, 4, 6, 8, 10, 11,
13, 15, 17, 19
-
20
-
-
STATIC II BURN-IN (Note 1)
3, 5, 7, 9, 12, 14, 16, 18
10
-
1, 2, 4, 6, 8, 11, 13,
15, 17, 19, 20
-
-
DYNAMIC BURN-IN (Note 2)
-
1, 10, 19
3, 5, 7, 9, 12, 14, 16,
18
20
2, 4, 6, 8, 11,
13, 15, 17
-
NOTES:
1. Each pin except VCC and GND will have a resistor of 10K
±
5% for static burn-in
2. Each pin except VCC and GND will have a resistor of 680
±
5% for dynamic burn-in
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V
±
0.5V
3, 5, 7, 9, 12, 14, 16, 18
10
1, 2, 4, 6, 8, 11, 13, 15, 17, 19, 20
NOTE: Each pin except VCC and GND will have a resistor of 47K
±
5% for irradiation testing. Group E,
Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number
518763
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| HCS244D | Radiation Hardened Octal Buffer/Line Driver, Three-State |
| HCS244DMSR | Radiation Hardened Octal Buffer/Line Driver, Three-State |
| HCS244DTR | Radiation Hardened Octal Buffer/Line Driver, Three-State |
| HCS244K | Radiation Hardened Octal Buffer/Line Driver, Three-State |
| HCS244KTR | Radiation Hardened Octal Buffer/Line Driver, Three-State |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| HCS244T | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Octal Buffer/Line Driver, Three-State |
| HCS245DMSR | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:Single 8-bit Bus Transceiver |
| HCS245KMSR | 制造商:Intersil Corporation 功能描述: |
| HCS245MS | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Octal Bus Transceiver, Three-State, Non-Inverting |
| HCS253D | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Dual 4-Input Multiplexer |
發(fā)布緊急采購(gòu)，3分鐘左右您將得到回復(fù)。