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參數資料
| 型號： | HCTS00D |
| 廠商： | Intersil Corporation |
| 英文描述： | Radiation Hardened Quad 2-Input NAND Gate |
| 中文描述： | 輻射加固四2輸入與非門 |
| 文件頁數： | 5/9頁 |
| 文件大?。?/td> | 49K |
| 代理商： | HCTS00D |
374
Specifications HCTS00MS
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OPEN
GROUND
1/2 VCC = 3V
±
0.5V
VCC = 6V
±
0.5V
OSCILLATOR
50kHz
25kHz
STATIC BURN-IN I TEST CONDITIONS (Note 1)
3, 6, 8, 11
1, 2, 4, 5, 7, 9, 10, 12,
13
-
14
-
-
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
3, 6, 8, 11
7
-
1, 2, 4, 5, 9, 10, 12,
13, 14
-
-
DYNAMIC BURN-IN I TEST CONNECTIONS (Note 2)
-
7
3, 6, 8, 11
14
1, 2, 4, 5, 9, 10,
12, 13
-
NOTES:
1. Each pin except VCC and GND will have a resistor of 10K
±
5% static burn-in.
2. Each pin except VCC and GND will have a resistor of 1K
±
5% dynamic burn-in.
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V
±
0.5V
3, 6, 8, 11
7
1, 2, 4, 5, 9, 10, 12, 13, 14
NOTE: Each pin except VCC and GND will have a resistor of 47K
±
5%. Group E, Subgroup 2,
sample size is 4 dice/wafer, 0 failures.
Spec Number
518774
相關PDF資料 |
PDF描述 |
|---|---|
| HCTS00HMSR | Radiation Hardened Quad 2-Input NAND Gate |
| HCTS00DMSR | Radiation Hardened Quad 2-Input NAND Gate |
| HCTS00K | Radiation Hardened Quad 2-Input NAND Gate |
| HCTS00KMSR | Radiation Hardened Quad 2-Input NAND Gate |
| HCTS00MS | Radiation Hardened Quad 2-Input NAND Gate |
相關代理商/技術參數 |
參數描述 |
|---|---|
| HCTS00DMSR | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Quad 2-Input NAND Gate |
| HCTS00HMSR | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Quad 2-Input NAND Gate |
| HCTS00K | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Quad 2-Input NAND Gate |
| HCTS00KMSR | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Quad 2-Input NAND Gate |
| HCTS00MS | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Quad 2-Input NAND Gate |
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