- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄371786 > HCTS163MS (Intersil Corporation) Radiation Hardened Synchronous Counter PDF資料下載
參數(shù)資料
| 型號： | HCTS163MS |
| 廠商： | Intersil Corporation |
| 元件分類： | 通用總線功能 |
| 英文描述： | Radiation Hardened Synchronous Counter |
| 中文描述： | 抗輻射能力同步計數(shù)器 |
| 文件頁數(shù)： | 6/9頁 |
| 文件大?。?/td> | 152K |
| 代理商： | HCTS163MS |
575
Specifications HCTS163MS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test
I
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test
II
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Interim Test
III
(Postburn-In)
100%/5004
1, 7, 9
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTE:
1. Alternate group A testing in accordance with method 5005 of MIL-STD-883 may be exercised.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
TEST
READ AND RECORD
PRE RAD
POST RAD
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4 (Note 1)
NOTE:
1. Except FN test which will be performed 100% Go/No-Go.
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OPEN
GROUND
1/2 VCC = 3V
±
0.5V
VCC = 6V
±
0.5V
OSCILLATOR
50kHz
25kHz
STATIC BURN-IN I TEST CONNECTIONS (Note 1)
11 - 15
1 - 10
-
16
-
-
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
11 - 15
8
-
1 - 7, 9, 10, 16
-
-
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
-
4, 6, 8
11 - 15
1, 3, 5, 7, 9, 10, 16
2
-
NOTES:
1. Each pin except VCC and GND will have a resistor of 10K
±
5% for static burn-in
2. Each pin except VCC and GND will have a resistor of 1K
±
5% for dynamic burn-in
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V
±
0.5V
11 - 15
8
1 - 7, 9, 10, 16
NOTE: Each pin except VCC and GND will have a resistor of 47K
±
5% for irradiation testing.
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number
518600
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| HCTS163D | Radiation Hardened Synchronous Counter |
| HCTS163DMSR | Radiation Hardened Synchronous Counter |
| HCTS163K | Radiation Hardened Synchronous Counter |
| HCTS163HMSR | Radiation Hardened Synchronous Counter |
| HCTS193KMSR | Radiation Hardened Synchronous 4-Bit Up/Down Counter |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| HCTS164D | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened 8-Bit Serial-In/Parallel-Out Shift Register |
| HCTS164DMSR | 制造商:Intersil Corporation 功能描述:SHIFT REGISTER SGL 8BIT SERL TO PARALLEL 14PIN SBDIP - Rail/Tube |
| HCTS164HMSR | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened 8-Bit Serial-In/Parallel-Out Shift Register |
| HCTS164K | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened 8-Bit Serial-In/Parallel-Out Shift Register |
| HCTS164KMSR | 制造商:Intersil Corporation 功能描述:SHIFT REGISTER SGL 8BIT SERL TO PARALLEL 14PIN CFLATPACK - Bulk |
發(fā)布緊急采購，3分鐘左右您將得到回復(fù)。