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參數(shù)資料
| 型號： | HCTS27D |
| 廠商： | Intersil Corporation |
| 英文描述： | Radiation Hardened Triple 3-Input NOR Gate |
| 中文描述： | 輻射加固三3輸入或非門 |
| 文件頁數(shù)： | 5/9頁 |
| 文件大?。?/td> | 54K |
| 代理商： | HCTS27D |
434
Specifications HCTS27MS
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
TEST
READ AND RECORD
PRE RAD
POST RAD
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4 (Note 1)
NOTE:
1. Except FN test which will be performed 100% Go/No-Go.
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OPEN
GROUND
1/2 VCC = 3V
±
0.5V
VCC = 6V
±
0.5V
OSCILLATOR
50kHz
25kHz
STATIC BURN-IN I TEST CONDITIONS (Note 1)
6, 8, 12
1 - 5, 7, 9, 10, 11, 13
-
14
-
-
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
6, 8, 12
7
-
1 - 5, 9, 10, 11, 13, 14
-
-
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
-
7
6, 8, 12
14
1 - 5, 9, 10, 11, 13
-
NOTES:
1. Each pin except VCC and GND will have a resistor of 10K
±
5% for static burn-in.
2. Each pin except VCC and GND will have a resistor of 1K
±
5% for dynamic burn-in.
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V
±
0.5V
6, 8, 12
7
1 - 5, 9, 10, 11, 13, 14
NOTE: Each pin except VCC and GND will have a resistor of 47K
±
5% for irradiation testing.
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number
518643
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相關代理商/技術參數(shù) |
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| HCTS27DMSR | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Triple 3-Input NOR Gate |
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| HCTS27K | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Triple 3-Input NOR Gate |
| HCTS27KMSR | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Triple 3-Input NOR Gate |
| HCTS27MS | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Triple 3-Input NOR Gate |
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